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High resolution electron microscopy in association with interactive computing

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Abstract

Although facilities for high resolution electron microscopy (HREM) are available, interpretation of micrographs at high magnifications is far from unambiguous. The interpretation of the micrographs using a computed structure analysis program is therefore necessary. The paper presents the theory behind HREM, together with a computer method for image interpretation. Special reference is made to the JEOL JEM 200CX transmission electron microscope used in the study of sodium beta-alumina.

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References

  1. J. M. Cowley, “Diffraction Physics” (North Holland/American Elsevier, Amsterdam 1975).

    Google Scholar 

  2. C. J. Humphreys andJ. C. H. Spence,Optik 58 (No. 2) (1981) 125.

    Google Scholar 

  3. M. A. O'Keefe, 37th Annual Proceedings of the Electron Microscopy Society of America, San Antonio, Texas, August 1979, edited by G. W. Bailey (Claitor's Publicating Division, Baton Rouge, 1979) p. 556.

    Google Scholar 

  4. J. M. Cowley,Chem. Scripta 14 (1978–79) 279.

    Google Scholar 

  5. J. G. Allpress, E. A. Hewat, A. F. Moodie andJ. V. Sanders,Acta Crystallogr. A28 (1972) 528.

    Google Scholar 

  6. D. F. Lynch andM. A. O'Keefe,ibid. A28 (1972) 536.

    Google Scholar 

  7. G. R. Anstis, D. F. Lynch, A. F. Moodie andM. A. O'Keefe,ibid. A29 (1973) 138.

    Google Scholar 

  8. M. A. O'Keefe,ibid. A29 (1973) 389.

    Google Scholar 

  9. D. F. Lynch, A. F. Moodie andM. A. O'Keefe,ibid. A31 (1975) 300.

    CAS  Google Scholar 

  10. M. A. O'Keefe andJ. V. Sanders,ibid. A31 (1975) 307.

    Google Scholar 

  11. J. M. Cowley andA. F. Moodie,Proc. Soc. Phys. 76 (1960) 378.

    Article  Google Scholar 

  12. P. Goodman andA. F. Moodie,Acta Crystallogr. A30 (1974) 280.

    Google Scholar 

  13. A. J. Skarnulis,J. Appl. Crystallogr. 12 (1979) 636.

    Article  CAS  Google Scholar 

  14. C. A. Beevers andM. A. S. Ross,Z. Krist. 97 (1937) 59.

    CAS  Google Scholar 

  15. “International Tables for X-ray Crystallography”, Vol. 1, edited by N. F. M. Hewry and K. Lonsdale (Kynoch Press, Birmingham, 1965) p. 304 (published for the Union of Crystallography).

    Google Scholar 

  16. O. Kübler, M. Hahn andJ. Seredynski,Optik 51 (1978) 171.

    Google Scholar 

  17. Idem, ibid. 51 (1978) 235.

    Google Scholar 

  18. W. O. Saxton, “Computing Techniques for Images Processing”, Advances in Electronics and Electron Physics, Supplement 10 (Academic Press, London, 1978).

    Google Scholar 

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Author notes

  1. J. C. Jones

    Present address: Scientific Services Department, Central Electricity Generating Board, Gravesend, Kent, UK

Authors and Affiliations

  1. Department of Metallurgy and Science of Materials, University of Oxford, Oxford, UK

    J. C. Jones

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  1. J. C. Jones
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Jones, J.C. High resolution electron microscopy in association with interactive computing. J Mater Sci 19, 533–544 (1984). https://doi.org/10.1007/BF02403241

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  • DOI: https://doi.org/10.1007/BF02403241

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