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Far-field techniques for the characterization of single-mode fibres

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Abstract

The characterization of single-mode fibres is important not only for determining the system parameters for a particular fibre, but also for the specification of fibres for manufacturing purposes. We present a detailed analysis of two new methods of characterizing single-mode fibres. The ‘strip integrated far-field method’ involves measuring the light power passed by a thin slit scanned across the far-field pattern and the ‘area integrated far-field method’ involves measuring the light power passed by a knife edge scanned across the far-field pattern. It is shown that, for either method, the measured data is related to the transverse offset transmission coefficient by the Fourier-cosine transform and hence that the far-field r.m.s. spot-size can be directly calculated. Noise analysis shows that the area integrated far-field method is superior to the strip integrated far-field method and similar to the ‘far-field mask method’ when a broadband light source is used to measure the far-field r.m.s. spot-size. It is also shown that the area integrated far-field method has smaller systematic errors than the far-field mask method.

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Samson, P.J. Far-field techniques for the characterization of single-mode fibres. Opt Quant Electron 18, 5–22 (1986). https://doi.org/10.1007/BF02069355

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  • DOI: https://doi.org/10.1007/BF02069355

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