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Effect of Ga and As sublayers on the structures and properties of Ni-GaAs contacts

  • Semiconductor and Dielectric Physics
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Abstract

Studies were made of heat-treated Ni-GaAs contacts, at which, prior to the electrochemical deposition of nickel, thin layers of gallium or arsenic were deposited. The physicochemical reactions at the interfaces were investigated, as well as the electrophysical characteristics of the diodes, the morphology of the metallic coatings, and the mechanical stresses. The phase composition of the contacts and the height of the barrier are seen to be practically independent of the introduction of excess Ga or As, whereas the thermal stability of the electrical parameters of the diodes varies considerably. This difference is associated with the effect of the Ga and As sublayers on the magnitude of the mechanical stresses arising at the metal-semiconductor interface.

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Literature cited

  1. I. D. Romanova, N. K. Maksimova, et al., Poverkhn., Fiz., Khim. Mekh., No. 1, 106 (1984).

    Google Scholar 

  2. I. D. Romanova, N. K. Maksimova, et al., Izv. Vyssh. Uchebn. Zaved., Fiz., No. 4, 151 (1976).

    Google Scholar 

  3. M. Ogawa, Thin Solid Films,70, 181 (1980).

    Google Scholar 

  4. L. G. Kositsyn, V. P. Yanovskii, et al., Poverkhn., Fiz., Khim. Mekh., No. 9, 38 (1982).

    Google Scholar 

  5. V. G. Bozhkov, V. M. Zavodchikov, et al., élektron. Tekh., Ser. 2, Poluprovodn. Prib., No. 7 (126), 41 (1978).

    Google Scholar 

  6. I. D. Romanova, N. K. Maksimova, in: Semiconductor Devices with a Schottky Barrier. Collection of Articles [in Russian], Naukova Dumka, Kiev (1979), p. 182.

    Google Scholar 

  7. V. T. Cherepin and M. A. Vasil'ev, Secondary Ion-Ion Emission of Metals and Alloys [in Russian], Naukova Dumka, Kiev (1975).

    Google Scholar 

  8. A. P. Byatkin, L. G. Kositsyn, et al., Izv. Vyssh. Uchebn. Zaved., Fiz., No. 4, 7 (1981).

    Google Scholar 

  9. Akio Hiraki, Semiconductor Technology, Jpn. Annu. Rev. Electron., Comput., and Telecommun., Tokyo, Amsterdam (1981), p. 36.

    Google Scholar 

  10. C. Barrett and E. J. Massies, J. Vac. Sci. Technol.,B1, No. 3, 819 (1983).

    Google Scholar 

  11. A. P. Vyatkin and N. K. Maksimova, Izv. Vyssh. Uchebn. Zaved., Fiz., No.10, 96 (1983).

    Google Scholar 

  12. N. G. Filonov, N. K. Maksimova, et al., Phys. Status Solidi (a),83, 701 (1984).

    Google Scholar 

  13. V. G. Bozhkov, O. Yu. Malakhovskii, and A. M. Misik, Izv. Vyssh. Uchebn. Zaved., Fiz., No. 3, 97 (1983).

    Google Scholar 

  14. A. E. Vol, The Constitution and Properties of Binary Metallic Systems [in Russian], Vol. 2, Fizmatgiz, Moscow (1969).

    Google Scholar 

  15. M. G. Mil'vidskii and V. B. Osvenskii, Structural Defects in Semiconductor Single Crystals [in Russian], Metallurgiya, Moscow (1984).

    Google Scholar 

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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 5, pp. 46–51, February, 1987.

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Romanova, I.D., Maksimova, N.K., Potakhova, L.Y. et al. Effect of Ga and As sublayers on the structures and properties of Ni-GaAs contacts. Soviet Physics Journal 30, 131–136 (1987). https://doi.org/10.1007/BF00898151

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  • DOI: https://doi.org/10.1007/BF00898151

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