Abstract
In this paper we study the problem (E) + (BC) + (IC) (see below) which represents a model for integrated circuits. We assume that the distributed parametersr(x) andc(x) are nonconstant, dielectric leakages depend on thex-coordinate as well as the voltage level, while the interconnecting multiport is nonlinear and possibly multivalued.
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Morosanu, G., Marinov, C. & Neittaanmäki, P. Well-posed nonlinear problems in integrated circuits modeling. Circuits Systems and Signal Process 10, 53–69 (1991). https://doi.org/10.1007/BF01183240
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DOI: https://doi.org/10.1007/BF01183240