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A procedure based on successive convolution operations is developed and associated with the Warren-Averbach method. Applications to cold-worked lithium fluoride samples are presented. The microstrain results are compared with those obtained in the classical way including the use of the direct deconvolution method. It is shown experimentally that the difficulties involved in the deconvolution operation have no significant effect on the evaluation of microstrains by the classical X-ray line-profile analysis.
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