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Positron implantation profile in nickel

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Abstract

A method for measurement of the positron implantation profile in the geometry employed in most positron annihilation experiments is described. The method is applied to the case of Ni as absorber and22Na as positron emitter. The experimental accuracy is discussed and a proposal for its improvement is outlined. Since absorption studies of positrons is usually performed in geometries quite different from the present, we give a short discussion on the impact of these differences on the transmission curves obtained.

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Authors and Affiliations

  1. Laboratory of Applied Physics II, Technical University of Denmark, DK-2800, Lyngby, Denmark

    H. E. Hansen, S. Linderoth & K. Petersen

Authors
  1. H. E. Hansen
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  2. S. Linderoth
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  3. K. Petersen
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Hansen, H.E., Linderoth, S. & Petersen, K. Positron implantation profile in nickel. Appl. Phys. A 29, 99–103 (1982). https://doi.org/10.1007/BF00632435

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