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Studies on phase transformations of Cu-phthalocyanine thin films

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Abstract

Copper phthalocyanine (CuPc) thin films were obtained by a sublimation technique on Si wafer substrates maintained at room temperature. As-deposited CuPc films with less than 0.1 μm thickness crystallize primarily in the α-form with a preferential orientation of the crystallites in the [2 0 0] direction. The effect of randomizing of the orientation of the CuPc crystallites is observed as the film thickness increases, whereas the preference in appearance of the α-form remains. The changes in phase composition, structure, morphology and surface chemical composition of as-deposited CuPc thin films due to different heat treatment conditions were investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS).

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Authors and Affiliations

  1. Semiconductor and Microsystems Technology Laboratory, Dresden University of Technology, Dresden, Germany

    O. Berger

  2. Semiconductor and Microsystems Technology Laboratory, Dresden University of Technology, Dresden, Germany

    W.-J. Fischer, B. Adolphi & S. Tierbach

  3. Fraunhofer Institute of Nondestructive Testing (IZFP), EADQ, Dresden, Germany

    V. Melev & J. Schreiber

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  1. O. Berger
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  2. W.-J. Fischer
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  3. B. Adolphi
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  4. S. Tierbach
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  5. V. Melev
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  6. J. Schreiber
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Berger, O., Fischer, WJ., Adolphi, B. et al. Studies on phase transformations of Cu-phthalocyanine thin films. Journal of Materials Science: Materials in Electronics 11, 331–346 (2000). https://doi.org/10.1023/A:1008933516940

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