References
R. EINZINGER,Appl. Surf. Sci. 3 (1979) 390.
H. D. PARK and D. A. PAYNE, in “Grain boundary phenomena in electronic ceramics”, Advances in Ceramics, Vol. 1, edited by L. M. Levinson (American Ceramic Society, Columbus, Ohio, 1981) p. 242.
K. MAEDA, T. MIYOSHI, Y. TAKEDA, K. NAKAMURA, S. OGIHARA and M. URA, in “Additives and interfaces in electronic ceramics”, Advances in Ceramics, Vol. 7, edited by M. F. Yan and A. H. Heuer (American Ceramic Society, Columbus, Ohio, 1983) p. 260.
H. NEMOTO and I. ODA,J. Amer. Ceram. Soc. 63 (1980) 398.
F. M. SMITS,Bell Syst. Tech. J. 20 (1958) 711.
H. R. PHILIPP and L. M. LEVINSON,J. Appl. Phys. 47 (1976) 1112.
K. MUKAE, K. TSUDA and I. NAGASAWA,Jpn. J. Appl. Phys. 16 (1977) 1361.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Sumino, H., Sakurai, O., Shinozaki, K. et al. A new instrument to measure the electrical properties in very narrow regions in ceramics. J Mater Sci Lett 10, 1026–1028 (1991). https://doi.org/10.1007/BF00721835
Received:
Accepted:
Issue Date:
DOI: https://doi.org/10.1007/BF00721835