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An ellipsometer with variable angle of incidence for studies in ultrahigh vacuumThe windows for the vacuum chamber are incorporated into the optical bench system by means of flexible bellows which allow measurements to be made over a large range of angle of incidence, one of which is chosen so that maximum sensitivity is obtained. The principal angle of incidence was determined, and straightforward corrections for strain birefringence of vacuum chamber windows were made. Atomically clean surfaces of sodium chloride and lithium fluoride were investigated to verify the performance of the system. Submonolayer and monolayer coverage of water on these surfaces could be detected. On cleavage planes of NaCl, a first monolayer of adsorbed water is complete at about one torr only.
Document ID
19740026745
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Walter, H. U. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Weitzenkamp, L. A. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Peters, P. N. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
September 3, 2013
Publication Date
August 30, 1974
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA-TM-X-64884
Accession Number
74N34858
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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