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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 2206-2208 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The hysteretic behavior of interfacial magnetic moments for CoFe thin films with varying roughness is determined in an element specific manner by monitoring the applied magnetic field dependence of the specular and off-specular (diffuse) contributions to the x-ray resonant magnetic scattering signal. Increasing the interfacial roughness generates a larger variation of the relative coercive field associated with the interfacial moment in comparison to the bulk. © 1998 American Institute of Physics.
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  • 2
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The nature of the interlayer coupling in epitaxial Fe(110)/Ag(111) multilayer structures was investigated using a highly surface-sensitive Mössbauer spectroscopy technique. The films were grown by molecular beam epitaxy and analyzed with x-ray diffraction and in situ RHEED to verify their crystallinity and orientation. All the films took the general form [56Fe3057Fe2Agx]15, where x=3 to 22 monolayers (ML). The entire film is invisible to the Mössbauer effect except for the 2 ML 57Fe layers, which therefore act as a probe of the magnetic environment of the Fe surfaces. Information regarding the surface spin-wave spectrum can then be obtained by measuring the temperature dependence of the hyperfine field at the surface. In the limit of no Ag interlayer, the 57Fe probe layers would be in direct contact with 56Fe on both sides and therefore should display a (1−BT3/2) hyperfine field temperature dependence, with B=5.2×10−6 K−3/2. As the Ag interlayer thickness is increased, we expect the hyperfine field to follow a (1−kBT3/2) temperature dependence, with 1〈k〈3.5 depending on the strength of the interlayer exchange. In addition, we expect an enhancement in H(0), the hyperfine field at 0 K, as the surface exchange decreases. The RHEED and x-ray studies showed all the samples to be single-crystalline and well-oriented, with no Bragg reflections other than Fe(110) and Ag(111) present. As the Ag interlayer thickness increased, the films showed the expected softening of the spin-wave spectrum, with k increasing from 1 at x=0 to 2.2 at x=22. However, a clear oscillation in k was observed at x=6 ML, and a possible second oscillation visible at x=12 ML. This implies an oscillation superimposed upon the monotonically decreasing interlayer exchange. The value of H(0) also shows a similar oscillation at x=6 ML.
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 83 (1998), S. 6290-6292 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The behavior of chemical and magnetic interfaces is explored using diffuse x-ray resonant magnetic scattering (XRMS) for CoFe thin films with varying interfacial roughnesses. A comparison of the chemical versus magnetic interfaces shows distinct differences in the behavior of these two related interfaces as the chemical roughness is increased. Such changes appear to be correlated with the behavior of the magnetic hysteresis of the interface, measured by tracking the diffuse XRMS intensity as a function of applied magnetic field. © 1998 American Institute of Physics.
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  • 4
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We use a surface-sensitive Mössbauer spectroscopy technique to examine the spin-wave spectrum, at the Fe(110)/NM(111) interface only, of a multilayer structure with a noble metal (NM) interlayer. We find that the temperature dependence of the hyperfine field follows a Bloch law (1−BT3/2), and use spin-wave calculations to connect the surface spin-wave stiffness parameter, B, to the interlayer exchange coupling. Films grown with Ag(111) interlayers show clear oscillations with a period of 6 ML, in good agreement with recent predictions.
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 73 (2002), S. 1408-1410 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: To use the unique element-specific nature of polarized x-ray techniques to study a wide variety of problems related to magnetic materials, we have developed a dual-branch sector that simultaneously provides both hard and soft x-ray capabilities. This facility, which is located in sector 4, is equipped with two different insertion devices providing photons in both the intermediate (0.5–3 keV) and hard x-ray regions (3–100 keV). This facility is designed to allow the simultaneous branching of two undulator beams generated in the same straight section of the ring. © 2002 American Institute of Physics.
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  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 997-999 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A technique combining x-ray magnetic linear dichroism absorption spectroscopy and rotational hysteresis loops is demonstrated. This technique, x-ray magnetic linear loops (XMLL), is used to extract magnetocrystalline anisotropy information. Results from two systems, a polycrystalline Fe film, and an epitaxial Fe film which exhibit different magnetic anisotropies, are shown. The measured XMLL is described using a simple single-domain anisotropy model. © 2001 American Institute of Physics.
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  • 7
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 3806-3808 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Oxygen K-shell x-ray fluorescence was monitored from the MgO substrate of a metallic heterostructure system containing a buried SmCo permanent magnet layer. This fluorescence was utilized as a detector to record transmission yield spectra for the SmCo film at both the Co–L3,2 and Sm–M5,4 absorption edges. Ordinarily, traditional transmission yield spectroscopy in the soft x-ray regime is impossible to perform with films on single-crystal substrates. The measured intensity ratios agree with simulations to confirm the thickness information. The potential and limitations of this technique are discussed in comparison to standard total electron and fluorescence yield techniques and magnetic circular dichroism. © 1999 American Institute of Physics.
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  • 8
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 498-500 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Site-selective luminescence experiments were performed upon porous-silicon samples exposed to varying degrees of oxidation. The source of different luminescence bands was determined to be due to either quantum confinement in nanocrystalline silicon or defective silicon oxide. Of particular interest is the defective silicon-oxide luminescence band found at 2.1 eV, which was found to frequently overlap with a luminescence band from nanocrystalline silicon. Some of the historical confusion and debate with regards to the source of luminescence from porous silicon can be attributed to this overlap. © 2000 American Institute of Physics.
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 2603-2605 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Through a direct study of the chemical and magnetic interfacial disorder in conjunction with magnetic property measurements, evidence is presented that the grain size is the ultimate factor in determining the magnetic coercivity in CoFe thin film structures. © 2000 American Institute of Physics.
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 71 (1997), S. 276-278 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The order of layer switching in a NiFe/Cu/Co spin valve is determined directly using circular polarized x-ray resonant magnetic scattering. By monitoring changes in the angular dependence of the magnetic contributions to the reflectivity near the Fe L3 and Co L3 edges as a function of applied field, the order of layer switching is directly obtained. © 1997 American Institute of Physics.
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