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  • ELECTRONICS AND ELECTRICAL ENGINEERING  (1)
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    High-temperature measurements of Q-factor in rotated X-cut quartz resonators (1981)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: The Q-factors of piezoelectric resonators fabricated from natural and synthetic quartz with a 34 deg rotated X-cut orientation were measured at temperatures up to 325 C. The synthetic material, which was purified by electrolysis, retains a higher enough Q to be suitable for high temperature pressure-transducer applications, whereas the natural quartz is excessively lossy above 200 C for this application. The results are compared to results obtained previously at AT-cut resonators.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Lewis Research Center Proc. of the Conf. on High-Temp. Electron.; p 29-31
    Format: application/pdf
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