Publication Date:
2018-06-08
Description:
Single-event upset from heavy ions in measured for advanced commercial microprocessors, comparing upset sensitivity in registers and d-cache for several generations of devices. Multiple-bit upsets and asymmetry in registers upset cross sections are also discussed.
Keywords:
Space Radiation
Type:
2003 Nuclear and Space Radiation Effects (NSREC); Monterey, CA; United States
Format:
text
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