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  • 1
    Electronic Resource
    Electronic Resource
    I(V) characteristics of one-dimensional tunnel junction arrangements (1998)
    Springer
    Applied physics 66 (1998), S. S735 
    Details
    ISSN: 1432-0630
    Keywords: PACS: 73.40.Gk; 73.23.Hk
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s003390051232
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  • 2
    Electronic Resource
    Electronic Resource
    MAGNETIC FORCE MICROSCOPY (1999)
    Palo Alto, Calif. : Annual Reviews
    Annual Review of Materials Research 29 (1999), S. 53-87 
    Details
    ISSN: 0084-6600
    Source: Annual Reviews Electronic Back Volume Collection 1932-2001ff
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract This review on magnetic force microscopy does not provide an exhaustive overview of the past accomplishments of the method but rather discusses the present state of the art. Magnetic force microscopy is a special mode of noncontact operation of the scanning force microscope. This mode is realized by employing suitable probes and utilizing their specific dynamic properties. The particular material composition of the probes and the dynamic mode of their operation are discussed in detail. The interpretation of images acquired by magnetic force microscopy requires some basic knowledge about the specific near-field magnetostatic interaction between probe and sample. The general magnetostatics as well as convenient simplifications of the general theory, which often can be used in practice, are summarized. Applications of magnetic force microscopy in the magnetic recording industry and in the fundamental research on magnetic materials are discussed in terms of representative examples. An important aspect for any kind of microscopy is the ultimately achievable spatial resolution and inherent restrictions in the application of the method. Both aspects are considered, and resulting prospects for future methodical improvements are given.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1146/annurev.matsci.29.1.53
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  • 3
    Electronic Resource
    Electronic Resource
    Combined ultrahigh vacuum scanning tunneling microscope scanning electron microscope system (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 2269-2273 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe a combined ultrahigh vacuum scanning tunneling microscope (STM)–scanning electron microscope (SEM) system, which allows to position the STM tip with respect to the sample within an area of 5 mm×5 mm under SEM control. While the SEM resolution is sufficient to clearly resolve sub-μm structures on the samples, the STM features atomic resolution on semiconductor surfaces. The combination of SEM and STM allows high-resolution studies on inhomogeneous samples in materials research as well as the use for micro- and nanoelectronic device characterization or device modification. The STM performance was checked by atomically resolved imaging of Si(111) (7×7) surfaces. The STM/SEM combination and its application in device characterization is demonstrated by the investigation of vertically grown resonant tunneling diodes on an AlAs/GaAs basis. Due to its performance the system has a high potential for high-resolution imaging in materials research, for novel device characterization and nanoscale structuring or modification of very small devices. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147045
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  • 4
    Electronic Resource
    Electronic Resource
    Fiber interferometer-based variable temperature scanning force microscope (1997)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 1776-1778 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A scanning force microscope designed for an operation at temperatures between 4.2 and 300 K is presented. The deflection of the microfabricated force sensing cantilever is detected via an optical fiber interferometer. For low temperature imaging the whole instrument is incorporated into a bath cryostat which is suitable for both liquid helium and liquid nitrogen cooling. The instrument is of highly symmetric design in order to avoid large inner misalignment of the interferometer due to thermal expansion/contraction during temperature changes. In addition to this thermally compensated design, the interferometer can be adjusted by piezo actuators in situ in three dimensions. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147992
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  • 5
    Electronic Resource
    Electronic Resource
    Anisotropic low-field magnetoresistance of polycrystalline manganite sensors (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 2513-2515 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic-field sensors of bulk La0.67Sr0.33MnO3 and La0.67Ba0.33MnO3 were fabricated. The investigations show that a large low-field magnetoresistance (MR) is exhibited by the polycrystalline samples. MR ratios of the sensors as large as 20% at 77 K and 1.5% at 298 K were observed in fields of 700 Oe. Corresponding field sensitivities as high as 170%/T at 3 mT and 298 K, and 700%–960%/T at 3–8 mT and 77 K were obtained. The low-field MR is associated with intergranular transport of spin-polarized electrons. It is found to be highly anisotropic. The phenomenon is discussed in terms of spin-polarized transport through two kinds of grain boundaries. These represent two extremes of grain-boundary environments. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.123024
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  • 6
    Electronic Resource
    Electronic Resource
    A combined ultrahigh vacuum scanning tunneling-scanning electron microscope system (1997)
    Springer
    Fresenius' journal of analytical chemistry 358 (1997), S. 77-79 
    Details
    ISSN: 1432-1130
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract A combined ultrahigh vacuum scanning tunneling-scanning electron microscope system is presented. This system allows to approach arbitrary locations on a sample within a range of 5 mm × 5 mm under electron microscopic control. The usefulness of this system is demonstrated by the characterization of a 1 μm wide photolithographically produced Ag microbridge on a Si(100) substrate.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s002160050349
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  • 7
    Electronic Resource
    Electronic Resource
    Eddy current microscopy (1998)
    Springer
    Applied physics 66 (1998), S. S409 
    Details
    ISSN: 1432-0630
    Keywords: PACS: 61.16.Ch; 81.70.E; 07.50.Yd; 07.55.Yv
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s003390051173
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  • 8
    Electronic Resource
    Electronic Resource
    Scanning tunneling spectroscopy on Au thin film structures deposited on highly oriented pyrolitic graphite (1998)
    Springer
    Applied physics 66 (1998), S. S149 
    Details
    ISSN: 1432-0630
    Keywords: PACS: 85.30.Mn; 73.23.-b; 73.40.-c
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s003390051119
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  • 9
    Electronic Resource
    Electronic Resource
    Morphology of Ag(100) thin films on Fe/GaAs(100) substrates: the influence of film thickness and annealing processes studied by scanning tunneling microscopy (1998)
    Springer
    Applied physics 66 (1998), S. 1133-1135 
    Details
    ISSN: 1432-0630
    Keywords: PACS: 68.55.-a; 61.16.Ch
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s003390051312
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  • 10
    Electronic Resource
    Electronic Resource
    Ultrahigh vacuum magnetic force microscopy on in situ grown iron thin films (1998)
    Springer
    Applied physics 66 (1998), S. 1191-1194 
    Details
    ISSN: 1432-0630
    Keywords: PACS: 75.60.Ch; 75.70.-i; 61.16.Ch
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s003390051324
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