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  • 1
    ISSN: 0392-6737
    Keywords: Studies of specific magnetic materials ; Optical properties of thin films surfaces and layer structures (superlattices, heterojunctions and multilayers) ; Excitons and related phenomena (including electron-hole drops) ; Conference proceedings
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Summary Two qualitatively different e-h systems have been investigated in undoped CdTe/Cd0.88Mn0.12Te and Cd0.97Mn0.03 Te/Cd0.75Mn0.25 Te QWs at 2 K and magnetic fields up to 14 T, namely a strongly spin-depolarized system in the CdTe QW and a highly spin-polarized one in the Cd0.97Mn0.03 Te QW. The interaction of the spin-aligned excitons is repulsive. In contrast, in the spectra of a dense spin-depolarized excitonic system an additional well pronounced emission lineM was observed at approximately 5 meV below the excitonic line. This line is assigned to the emission of molecules consisting of excitons with opposite spins of both electrons and holes.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 17 (1995), S. 1729-1733 
    ISSN: 0392-6737
    Keywords: Time-resolved optical spectroscopies and other ultrafast optical measurements in condensed matter ; II–VI compounds and other chalcogenides ; Conference proceedings
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Summary Picosecond photoluminescence spectroscopy was used to investigate the recombination dynamics of excitons in deep etched CdZnSe/ZnSe quantum wires with lateral extensions down to 20 nm. In the low-temperature regime (T≤10 K), no significant reduction of the exciton lifetime was found down to a wire width of 20 nm, indicating a negligible influence of carrier loss at the wire sidewalls. At higher temperatures, the lifetime decreases for decreasing wire width,e.g., from 330 ps in the mesa structure to 21 ps in the 28 nm wide wires at room temperature. Simple model calculations indicate that this drop of the lifetime is due to diffusive carrier transport to the wire sidewalls and subsequent non-radiative surface recombination.
    Type of Medium: Electronic Resource
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