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  • 11
    Electronic Resource
    Electronic Resource
    The effect of solvent on the position of the first absorption band of nitrobenzene
    Amsterdam : Elsevier
    Chemical Physics Letters 31 (1975), S. 46-47 
    Details
    ISSN: 0009-2614
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0009-2614(75)80054-6
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  • 12
    Electronic Resource
    Electronic Resource
    Improvement of the thermal stability of W/C multilayers (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 931-937 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A series of W/C multilayers has been fabricated using a magnetron sputtering device. In order to establish comparison with other multilayers produced by several laboratories, their atomic structure and thermal evolution has been studied by small- and wide-angle x-ray scattering, respectively, and Raman spectroscopy. By plotting the nominal thickness determined by the sputtering speed versus the thickness obtained by simulation of small-angle x-ray scattering spectra the existence has been confirmed of a WC interface compound of about 0.7 nm formed during the multilayer deposition. The multilayers fabricated by the magnetron sputtering device showed higher thermal stability and less period expansion than those produced by different apparatus [Dupuis et al., J. Appl. Phys. 68, 5146 (1990), Jiang et al., J. Appl. Phys. 65, 196 (1989)]. Raman spectra indicated that the carbon in the W/C multilayers is more graphitized than in the previous W/C multilayer. The carbon is further graphitized after annealing at 1000 °C. The graphitization of carbon induced its density to decrease, that is, thickness to increase. Consequently, in the multilayers a smaller expansion of carbon is expected after annealing at 1000 °C since there is more graphitized carbon in the initial as-deposited state than in the previous W/C multilayer. This conclusion agrees very well with the thickness variation measured by x-ray diffraction.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.351769
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  • 13
    Electronic Resource
    Electronic Resource
    Reproductive biology of the conger eel from the south coast of Brittany, France and comparison with the Europe eel (2001)
    Oxford, UK : Blackwell Publishing Ltd
    Journal of fish biology 59 (2001), S. 0 
    Details
    ISSN: 1095-8649
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Biology
    Notes: The gonadosomatic indices (IG) of female conger eel Conger conger, aged between 2 and 11 years postmetamorphosis, ranged between 0·04 and 4·78 and were correlated with both age and body length. Microscopical examination of the gonads showed immature ovaries at two main stages of oocyte development, pre-vitellogenic oocytes for IG 〈 1, and oocytes at an early vitellogenic stage (lipid vesicle stage) for IG〉1. The immaturity of the conger eels sampled in Concarneau Bay indicates that this species probably spawns in deeper oceanic waters. Radioimmunoassays (RIA) of sex steroids gave low serum levels of oestradiol and of 11-ketotestosterone, but higher levels of testosterone correlated with increase in IG. Immunoenzymatic assay (ELISA) indicated low serum levels of vitellogenin (VtG), which were significantly correlated with IG. The pre-vitellogenic and early vitellogenic stages observed in the coastal C. conger were similar to the oocyte stages found in the European eel Anguilla anguilla, at the yellow and silver phases of its life cycle respectively. However, other morpho-functional changes, associated with silvering in Anguilla species, such as the increase in ocular index, and regression of the digestive tract, did not occur at the early vitellogenic stage in conger eels.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1095-8649.2001.tb00131.x
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  • 14
    Electronic Resource
    Electronic Resource
    Raman scattering from carbon in tungsten/carbon multilayer films (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 249-254 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Period expansion after annealing in tungsten/carbon (W/C) multilayer films has been observed by several authors. Although most results have emphasized that the carbon layers play the important role in such thermal evolution, it is important to clarify the structure of the carbon atoms in those multilayers both before and after annealing in order to explain such period expansion more clearly. In this paper, Raman scattering is carried out on the W/C multilayers fabricated by various methods, all of which showed different period expansion values ranging from 0% to 20%. We show that the initial carbon in those multilayers becomes graphitized differently depending on the fabrication methods. The carbon fabricated by rf sputtering under a reactive gas has the highest amount of graphite component as compared with those prepared under a pure argon gas atmosphere. After annealing at 1000 °C, graphitization can be observed, but there are no obvious structural differences for the carbon in all the annealed W/C multilayer films. Such graphitization of the carbon layer causes a decrease in its density, and thus an increase in its thickness. Due to the different initial states of the carbon in the multilayers produced by the different methods and to the identical final state after annealing, the different carbon layer thickness expansions are expected and do agree with the small angle x-ray diffraction measurements.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.354153
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  • 15
    Electronic Resource
    Electronic Resource
    Characteristics and thermal behavior of W/Si multilayers with well-defined interfaces (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 3348-3355 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Multilayers consisting of alternating thin bilayers of W and Si (period: 1.5〈d〈9 nm) have been analyzed by x-ray scattering (absolute reflectivity, period, mosaicity, interface roughness, crystallinity, and density) and by cross-sectional transmission electron microscopy observations (periodicity, crystalline phase, and damaged area). Our purpose was to determine the thermal properties of the multilayers with respect to the period value under pulsed laser heating (with a nanosecond Nd-YAG laser at different energy densities up to 1 J/cm2 and at a wavelength λ=0.53 μm) and by furnace annealing (250〈T〈1000 °C under 10−7 Torr pressure). We propose that two distinct diffusion mechanisms are involved in annealings: first, interdiffusion in the amorphous phase and then crystallization into WSi2, the latter related to a period contraction of about 5–10%. The diffusion coefficients and the crystallization temperature depend drastically on the period value. Simulations of small-angle x-ray scattering curves take well into account this thermal evolution. Extinctions and modulations of the intensities of the Bragg peaks are well fitted by thickness and roughness variations.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.346388
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  • 16
    Electronic Resource
    Electronic Resource
    X-ray reflectivity and transmission electron microscopy studies on thin and ultrathin W/C and W/Si multilayers structures (1989)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 65 (1989), S. 3453-3458 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ultrathin and thin bilayers of W coupled with C and Si have been deposited by rf magnetron sputtering. Behavior of the multilayer structures (MLS) has been analyzed through two combined techniques: x-ray reflectivity and electron microscopy study and conventional (TEM) and high-resolution transmission (HRTEM). The experimental results we present provide average informations on the reflective characteristics of the mirrors in agreement with theory, comparative values of parameters (thickness and interfacial roughness of the bilayers), as well as structural characteristics of the stackings. We focused on ultrathin W/Si MLS with a bilayer thickness of 1.5 nm that present excellent regularity with effective roughness less than 3 A(ring). They offer reflective qualities to be used as reflectors with an angle 2θ〉6° in the first order for the medium x-ray range.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.342613
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  • 17
    Electronic Resource
    Electronic Resource
    X-ray supermirrors for BESSY II (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 4845-4846 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: X-ray multilayer supermirrors for the energy range up to 20 keV have been theoretically studied and experimentally measured with synchrotron radiation. A multilayer mirror with 50 W/Si bilayers with different thicknesses on the Si substrate has a smooth reflectivity of up to 32% in the whole energy range from 5 to 22 keV at a grazing incidence angle of 0.32° which is considerably larger than using total external reflection. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146162
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  • 18
    Electronic Resource
    Electronic Resource
    Characterization of multilayers for extended ultraviolet optics (1987)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 51 (1987), S. 880-882 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We describe an extensive characterization procedure developed to study multilayers for extended ultraviolet (XUV, 1 A(ring)(approximately-less-than)λ(approximately-less-than)1000 A(ring)) optics. We present results of this procedure applied to sputtered Si/W multilayers designed as normal-incidence XUV reflectors for ∼200 A(ring). Techniques used were low-angle x-ray diffraction, Bragg–Brentano and Seemann–Bohlin diffraction, wide-film Debye–Scherrer (Read) camera, Rutherford backscattering spectroscopy, and transmission electron microscopy. Reflectances at several incidence angles were measured with synchrotron radiation and found to agree very well with reflectance curves calculated without adjustable parameters. The information obtained from the different techniques forms a coherent picture of the structure of these materials.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.98842
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  • 19
    Electronic Resource
    Electronic Resource
    Crystallization of ultrathin W-Si multilayer structures by high-energy heavy ion irradiations (1990)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 1739-1741 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ultrathin amorphous multilayers structures (1.55 nm bilayer period) were irradiated by high-energy heavy ion (127I and 238U ions). Transmission electron microscopy study shows that the ion-material interaction in such a configuration leads to an irreversible transformation of the initial amorphous structures. In this letter, we report the first observation of the crystallization of the multilayers induced by the heavy ion irradiations with a subsequent formation of a new WSi structure. The crucial role of the electronic effects in the crystallization process is discussed relatively to the other phenomena induced under the ion irradiation.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.104052
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  • 20
    Electronic Resource
    Electronic Resource
    Magnetic and transport properties of Ni/Ti, NiC/Ti and Co/Cu multilayers at high fields
    Amsterdam : Elsevier
    Journal of Magnetism and Magnetic Materials 121 (1993), S. 409-412 
    Details
    ISSN: 0304-8853
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1016/0304-8853(93)91233-W
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