ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
The elements Nb, Zr, Ta, Y, Ce, Nd, Lu, Ba and Sr were calibrated on a wavelength-dispersive spectrometerequipped electron probe microanalyser (EPMA) using existing standards and a Ta-bearing primary glass standard manufactured for Ta calibration. These calibrations were tested using a manufactured secondary glass standard doped with 600-1800 ppm of these elements. The EPMA calibrations reproduced the glass secondary standard concentrations to within ±10% relative (except for Y) with detection limits of 40-100 ppm. The accuracy of this technique was compared with that of proton-induced x-ray emission (PIXE) determinations on the secondary standard.
Additional Material:
1 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300230210
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