ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A beam position monitor for small x-ray beams in an ultrahigh-vacuum environment is presented along with the results for a prototype. The instrument, initially conceived to monitor monochromatic beams, has shown to be useful for white radiation too. The integrated profiles of the spatial distribution of the beam are measured by scanning two perpendicular thin metallic wires across the detection area. The prototype has been tested with undulator beams at the European Synchrotron Radiation Facility and the measured resolution is better than 5 μm when full power beams are monitored. Beryllium and tungsten wires of 50 and 100 μm diam have been used for white and monochromatic beams, respectively, and typical peak current values are 500 nA and 400 pA for unfocused beams. The minimum scan time is 1 s and therefore this instrument is not suitable for fast position corrections. On the other hand it is inherently free of electronic drift and it is well suited to monitor the beam during long unattended experiments. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145813
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