Electronic Resource
Chichester [u.a.]
:
Wiley-Blackwell
Surface and Interface Analysis
17 (1991), S. 551-555
ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
Thin oxide films on four kinds of commercial sheet were characterized with Auger electron spectroscopy (AES) and glow discharge optical emission spectroscopy (GDS). Enrichment of alloying elements was noticed in the thin oxide films formed in air. The depth profiles obtained by AES with ion sputtering showed that enrichment of chromium occurred at the interface between the oxide and the matrix. It was difficult with AES to obtain the profiles of silicon and manganese because of overlap of their peaks with the iron peaks on the spectrum. On the other hand, with GDS, silicon and manganese could be analysed quantitatively in thin films that are 〈0.05 μm thick.
Additional Material:
8 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/sia.740170803
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