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  • Chemistry  (16)
  • ELECTRONICS AND ELECTRICAL ENGINEERING  (5)
  • PHYSICS, PLASMA  (5)
  • CHEMISTRY AND MATERIALS (GENERAL)  (3)
  • 11
    Electronic Resource
    Electronic Resource
    Plastics patents: Extrusion (1993)
    Hoboken, NJ : Wiley-Blackwell
    Advances in Polymer Technology 2 (1993), S. 233-239 
    Details
    ISSN: 0730-6679
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/adv.1993.060020402
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    Paper (German National Licenses)
    Fulltext
  • 12
    Electronic Resource
    Electronic Resource
    Plastics patents: Materials (1983)
    Hoboken, NJ : Wiley-Blackwell
    Advances in Polymer Technology 3 (1983), S. 7-13 
    Details
    ISSN: 0730-6679
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/adv.1983.060030102
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    Paper (German National Licenses)
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  • 13
    Electronic Resource
    Electronic Resource
    Plastics patents: Molding (1993)
    Hoboken, NJ : Wiley-Blackwell
    Advances in Polymer Technology 2 (1993), S. 60-71 
    Details
    ISSN: 0730-6679
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/adv.1993.060020202
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    Paper (German National Licenses)
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  • 14
    Electronic Resource
    Electronic Resource
    Plastics patents: Additives (1984)
    Hoboken, NJ : Wiley-Blackwell
    Advances in Polymer Technology 3 (1984), S. 335-337 
    Details
    ISSN: 0730-6679
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/adv.1984.060030402
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    Paper (German National Licenses)
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  • 15
    Electronic Resource
    Electronic Resource
    Plastics patents: Additives (1984)
    Hoboken, NJ : Wiley-Blackwell
    Advances in Polymer Technology 4 (1984), S. 3-6 
    Details
    ISSN: 0730-6679
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/adv.1984.060040101
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    Paper (German National Licenses)
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  • 16
    Electronic Resource
    Electronic Resource
    Plastics patents: Molding and extrusion (1984)
    Hoboken, NJ : Wiley-Blackwell
    Advances in Polymer Technology 4 (1984), S. 101-106 
    Details
    ISSN: 0730-6679
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/adv.1984.060040202
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  • 17
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    Unknown
    Measurements of plasma energy density and conductivity from 3 to 120 kbar. (1967)
    In:  Other Sources
    Details
    Publication Date: 2011-08-11
    Description: Plasma energy density, conductivity and temperature measurements at various pressures
    Keywords: PHYSICS, PLASMA
    Type: JOURNAL OF APPLIED PHYSICS
    Format: text
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    NASA TECHNICAL REPORTS
  • 18
    facet.materialart.
    Unknown
    Plasma density measurements at 100 kilobars of pressure. (1966)
    In:  Other Sources
    Details
    Publication Date: 2011-08-11
    Description: Measurement of plasma density generated by underwater explosions, noting modes of electrical discharge and shock front role
    Keywords: PHYSICS, PLASMA
    Format: text
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    NASA TECHNICAL REPORTS
  • 19
    facet.materialart.
    Unknown
    Secondary electron emission from a charged dielectric (1985)
    In:  Other Sources
    Details
    Publication Date: 2011-08-19
    Description: Charges on the surface of fluorinated-ethylene-propylene affect its secondary electron emission coefficient. Measurements with impact energies exceeding that energy which causes peak emission have been made in regions where the local electric field produced by the surface charge is normal to the surface and in regions where it is oblique. The surface of the 6-mm wide specimen was charged to either 6 or 10 kV. Because the impinging primary beam was deflected by the charged specimen, numerical modeling was used to predict the beam's impact energy E, impact angle theta, and the impact point. The formula predicts the coefficient in the region of normal field up to 60 deg although E(0) depends upon the electric field and also on the history of the specimen. Near the edges where the field is oblique, the measured coefficient departs significantly from what the formula predicts.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Electrical Insulation (ISSN 0018-9367); EI-20; 485-491
    Format: text
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    NASA TECHNICAL REPORTS
  • 20
    facet.materialart.
    Unknown
    Charge distributions near metal-dielectric interfaces before and after dielectric surface flashover (1977)
    In:  CASI
    Details
    Publication Date: 2016-06-07
    Description: A technique was developed for measuring surface charge distribution near interfaces without placing any measuring apparatus near the face of the samples. The results of measurements which were made on FEP Teflon and Kapton dielectrics, before and after are given flashover, with various types of interfaces. Also given are data showing mean time between flashovers for various configurations exposed to a variety of environmental conditions. Several charge transfer mechanisms are considered as a means by which stable charge distributions may be maintained near interfaces.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Lewis Res. Center Proc. of the Spacecraft Charging-Technol. Conf.; p 503-717
    Format: application/pdf
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    NASA TECHNICAL REPORTS
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