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  • 11
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    Auger electron intensity variations in oxygen-exposed large grain polycrystalline silver (1989)
    In:  CASI
    Details
    Publikationsdatum: 2019-06-28
    Beschreibung: Auger electron spectroscopic studies of the grains in oxygen-charged polycrystal-line silver show significant intensity variations as a function of crystallographic orientation. These intensity variations were observed by studies of the Auger images and line scans of the different grains (randomly selected) for each silver transition energy. The results can be attributed to the diffraction of the ejected Auger electrons and interpreted by corresponding changes in the electron mean-free path for inelastic scattering and by oxygen atom accumulation in the subsurface. The subsurface (second layer) octahedral sites increased in size because of surface relaxation and serve as a stable reservoir for the dissolved oxygen.
    Schlagwort(e): ATOMIC AND MOLECULAR PHYSICS
    Materialart: NASA-TP-2930 , L-16579 , NAS 1.60:2930
    Format: application/pdf
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  • 12
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    High-Quality, Thin-Film Germanium Single Crystals (1986)
    In:  Other Sources
    Details
    Publikationsdatum: 2019-06-28
    Beschreibung: Germanium (Ge) has crystallographic characteristics similar to GaAs and compatible with heteroepitaxial growth of GaAs. Further, since efficient heteroface cells already grown on thick Ge single crystals, Ge is excellent substrate candidate for thin-film cells. Required is single-crystal Ge thin film. Method developed for epitaxially growing highquality 10-um Ge thin films on ,100. NaCl substrates by plasma-enhanced chemical-vapor deposition (PECVD) and then separating Ge films by either melt-away or differential-thermal shear stress techniques. Free-standing films used for growth of AlxGa1-xAs/GaAs heteroface cells by similar techniques.
    Schlagwort(e): FABRICATION TECHNOLOGY
    Materialart: LAR-13211 , NASA Tech Briefs (ISSN 0145-319X); 9; 3; P. 162
    Format: text
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  • 13
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    Introduction to total- and partial-pressure measurements in vacuum systems (1989)
    In:  CASI
    Details
    Publikationsdatum: 2019-06-28
    Beschreibung: An introduction to the fundamentals of total and partial pressure measurement in the vacuum regime (760 x 10 to the -16th power Torr) is presented. The instrument most often used in scientific fields requiring vacuum measurement are discussed with special emphasis on ionization type gauges and quadrupole mass spectrometers. Some attention is also given to potential errors in measurement as well as calibration techniques.
    Schlagwort(e): INSTRUMENTATION AND PHOTOGRAPHY
    Materialart: NASA-RP-1219 , L-16494 , NAS 1.61:1219
    Format: application/pdf
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  • 14
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    Ultrahigh-Vacuum Sample-Transfer System (1985)
    In:  Other Sources
    Details
    Publikationsdatum: 2019-06-28
    Beschreibung: Ultrahigh-vacuum (UHV) sample-transfer system developed features short-term (less than 30 minutes) transfer of samples from atmospheric pressure into sample manipulator within UHV analysis system without significantly degrading system pressure. New system is austere approach to sample transfer, involving no automation. Total cost of system is factor of 10 less than commercially available instruments.
    Schlagwort(e): PHYSICAL SCIENCES
    Materialart: LAR-12993 , NASA Tech Briefs (ISSN 0145-319X); 9; 1; P. 86
    Format: text
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  • 15
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    Manipulator for Heating and Cooling in Ultrahigh Vacuum (1985)
    In:  Other Sources
    Details
    Publikationsdatum: 2019-06-28
    Beschreibung: In sample-transfer system for use in ultrahigh vacuum, samples mounted on threaded circular holder transferred to flip mechanism of manipulator by simple translation and rotation. Flip mechanism contains electrode assembly and thermocouple that make direct contact with sample. Copper plate and flexible strap attached to receiving block to cool sample. Simple modifications allow broad range of sample temperatures (150 to 1,750 K) and direct temperature measurements, while retaining advantage of additional degree of freedom provided by flip mechanism of precise manipulator.
    Schlagwort(e): PHYSICAL SCIENCES
    Materialart: LAR-13040 , NASA Tech Briefs (ISSN 0145-319X); 9; 1; P. 80
    Format: text
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  • 16
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    Finite size corrections to Madelung number (1986)
    In:  Other Sources
    Details
    Publikationsdatum: 2019-07-12
    Beschreibung: It is customary in the study of ionic crystals to assume that the ions are point charges at their respective lattice sites; the corresponding electrostatic energy of one such ion is reducible to Madelung's form, where the Madelung number has a value of 1.7467. This paper considers the modifications in the electrostatic energy when the atomic finite size is treated in more detail. The results are tabulated as a direct correction to Madelung's number for alkali halide cubic crystals.
    Schlagwort(e): ATOMIC AND MOLECULAR PHYSICS
    Materialart: Journal of Chemical Physics (ISSN 0021-9606); 84; 543
    Format: text
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  • 17
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    Precise-Conductance Valve Insert (1986)
    In:  Other Sources
    Details
    Publikationsdatum: 2019-07-12
    Beschreibung: Valve modification provides two operating modes fully open and small, precise leak. Copper insert with radially oriented holes allows small, controllable, precise effusion rate when valve closed or nearly unobstructed flow when valve open. Numerous applications in surface physics, vacuum physics, materials science, gas kinetics, thin films, and other areas of research requiring measured flows of gas into or out of system.
    Schlagwort(e): MECHANICS
    Materialart: LAR-13340 , NASA Tech Briefs (ISSN 0145-319X); 10; 1; P. 97
    Format: text
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