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  • 11
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 109 (1998), S. 6684-6690 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Two Q branches of N2O near 579.3 and 2798 cm−1 belonging to the 2ν20e−ν21f and ν2+ν3 bands, respectively, of Σ←Π and Π←Σ symmetry, have been studied for He and N2 perturbers at pressures ranging from 0.1 to 2 atm, using a tunable diode laser and a difference-frequency laser spectrometer. To interpret the line-mixing effects in these spectra, we have applied a model based on the energy corrected sudden approximation whose parameters have been only derived from line-broadening data for N2O–He and also from the measured absorption by the Q branches for N2O–N2. This model provides a satisfactory agreement with experimental band shapes, whatever the band, the perturber and the pressure considered. Significantly larger line-mixing effects are shown for N2O–He with respect to N2O–N2. Finally, the assumption made in the calculations to treat separately the couplings in the even and odd j levels appears to have a negligible influence on the resulting band shapes. © 1998 American Institute of Physics.
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  • 12
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 3035-3041 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Atomic deposition techniques are investigated for binary semiconductors of the telluride family, namely CdTe and MnTe. An original method for directly determining the CdTe atomic layer epitaxy (ALE) growth rate—in monolayers/cycle—is proposed, consisting in monitoring the reflection high-energy electron diffraction (RHEED) sublimation intensity oscillations of an ALE grown CdTe layer deposited on a MgTe buffer layer. The ALE CdTe autoregulated growth rate at 0.5 monolayer/cycle (in the substrate temperature domain between 260 and 290 °C) is accounted for on the basis of an atomic model which relies on the alternating c(2×2) Cd and (2×1) Te surface reconstructions during the ALE cycle. RHEED studies on MnTe atomic deposition, together with x-ray diffraction and transmission electron microscopy on ALE grown CdTe/MnTe superlattices reveal that all deposited Mn atoms are incorporated so that no autoregulated growth can be achieved. Furthermore, less than one or just one monolayer of Mn must be sent on the surface per ALE cycle to obtain well controlled superlattices with abrupt interfaces. © 1996 American Institute of Physics.
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  • 13
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 5266-5269 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A simple dispersion equation for surface thermal waves propagating along a solid surface covered with a thin film of higher thermal conductivity is presented. It is shown to describe well phase measurements with a photothermal microscope carried out on metal films on glass substrates. © 1995 American Institute of Physics.
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  • 14
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 2013-2018 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The thermoreflectance technique is applied for imaging electric current distributions and thermal transfer in a temperature reference resistor heated by an alternating current. High-frequency scans (30 kHz) allow imaging of the current density distribution in conducting strips of the resistor while scans of amplitude and phase of the surface temperature variation at lower frequencies reveal plane, cylindrical, and spherical thermal waves. We investigate wave dimensionality as a function of heating geometry and thermal length, and present a simple method allowing a quantitative thermal analysis by exploiting the phase profile of cylindrical thermal waves. © 1996 American Institute of Physics.
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  • 15
    ISSN: 1365-246X
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Geosciences
    Notes: In 1988, an extensive geophysical experiment was performed on the Lofoten passive continental margin, which was formed by the continental break-up between Greenland and northern Norway at 58 Ma. The geological units of the outer Lofoten margin are characterized by seaward-dipping reflectors (SDRs) and landward flood basalt, which extends up to 100 km landwards of SDRs. In this study, we obtain the P-wave velocity structure beneath the Lofoten Basin, the SDRs, and the landward flood basalt by use of ocean-bottom seismograph refraction profiling, and we also discuss the formation of the northern Norwegian passive continental margin.In the Lofoten Basin the crust is of oceanic type, consisting of sedimentary layers, oceanic laver 2 (4.9−5.5 km s−1), layer 3A (6.3−6.8 km s−1) and layer 3B (7.0−7.1 km s−1). Beneath the SDRs the crustal layers are identical to those of the Lofoten Basin, but the thickness of the lower crust, which represents the same velocity as layer 3B, increases to 5 km towards the continent side, and a high-velocity lower crustal layer (7.3 km s−1) is formed at the base of the crust. The ocean-continent transition zone is situated between the landward side of the SDRs and the northward continuation of the Vøring Plateau Escarpment. In this region the velocity of the lower crust gradually decreases and approaches the lower crustal velocity beneath the Lofoten Islands (6.8 km s−1). The model also indicates that the high-velocity layer disappears in this region. Comparing our model with the crustal structure on the Vøring margin, it is clear that the lower crustal body (≥7 km s−1) thickens southwards along the northern Norwegian continental margin. Recent results from petrological and geophysical studies of the generation of the oceanic crust have shown that increasing the temperature of the upwelling asthenospheric material increases the thickness of the oceanic crust. We interpret this as that the oceanic crust in the southern area in the Vøring-Lofoten margin was generated by hotter material than that of the northern area.
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  • 16
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 1510-1513 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Thermal conductivity of nickel and gold films on quartz (thickness 0.4–8 μm) was measured by a modulated thermoreflectance technique recording the surface temperature profile. Model calculations predict an optimum frequency for measuring thermal transport within the film. Measurements on films with various thicknesses reveal a thermal conductivity close to the bulk value for nickel while gold films exhibit a reduced conductivity with decreasing film thickness. © 1997 American Institute of Physics.
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  • 17
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 86 (1999), S. 845-849 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have studied the effects of inserting Si/Si0.6Ge0.4 strain-balanced superlattices (SLs) into Si0.8Ge0.2 (001) virtual substrates. The SiGe SL layer thickness chosen was larger than the critical thickness for elastic relaxation and generated numerous hemicylindrical features oriented along the 〈100〉 directions. These features lead, when covered by Si0.8Ge0.2, to a disruption of the well-ordered surface crosshatch along the 〈110〉 directions, and to a significant lowering of the surface roughness. There is also evidence for some filtering of the threading dislocations by the SL. © 1999 American Institute of Physics.
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  • 18
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 86 (1999), S. 1951-1957 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have performed large and small angle x-ray scattering measurements on CdTe/MgTe superlattices. The individual thicknesses of the CdTe and MgTe layers, together with the period dispersion and the crystallographic quality of the stacking, were extracted from large-angle x-ray diffraction. The Fresnel optical method and the distorted wave Born approximation were used to analyze the small angle x-ray scattering data. Specular reflectivity shows that the interface roughness is quite large for the two CdTe/MgTe superlattices grown either by conventional molecular beam epitaxy or by atomic layer epitaxy with however in the latter case a strong asymmetry between the direct and inverted interfaces. The effective MgTe concentration is determined from the refractive index. A model of correlated interface profiles is successfully used to simulate the diffuse scattering, and to gain access to the lateral correlation length of the roughness (Λ(parallel)=1500±750 Å for both samples); moreover, we demonstrate that the layers are almost completely correlated over the sample thickness in the growth direction. © 1999 American Institute of Physics.
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  • 19
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 84 (1998), S. 4300-4308 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Atomic layer epitaxy (ALE) is investigated together with conventional molecular beam epitaxy (MBE) for the growth of CdTe/MnTe superlattices. A systematic structural and magneto-optical study demonstrates that: (i) all Mn atoms incident on the surface get incorporated; however, when a quantity superior or equal to 1 monolayer of Mn is sent onto the surface per ALE cycle, the growth front roughens, leading to the formation of MnTe islands, (ii) optimized atomic layer epitaxy allows us to obtain at 280 °C CdTe/MnTe superlattices with a better control than in conventional MBE, but does not prevent the exchange between Cd and Mn atoms from occurring at the interfaces, (iii) low temperature ALE (200 °C and lower) seems to be a promising way of obtaining more abrupt interfaces. A precise value of the ratio of the elastic coefficients 2c12/c11 is otherwise inferred through this study for zincblende MnTe (1.12). © 1998 American Institute of Physics.
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  • 20
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 70 (1997), S. 1113-1115 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have grown by atomic layer epitaxy CdTe/MnTe tilted and serpentine superlattices. These heterostructures are formed by depositing in the step-flow growth mode fractional monolayer superlattices (CdTe)m(MnTe)n, with p=m+n∼1, onto 2 °A and 2 °B Cd0.95Zn0.05Te vicinal substrates. Transmission electron microscopy images reveal a good in-plane CdTe/MnTe separation and a uniform short-range superlattice period. The very existence of those superlattices imply that Te-based vicinal surfaces present a regular array of monomolecular steps, with no important step meandering and no step bunching. © 1997 American Institute of Physics.
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