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Orientational order of Langmuir–Blodgett films as determined by fluorescence anisotropy (1989)

LeGrange, Jane D. ; Riegler, Hans E. ; Zurawsky, Walter P. ; [weitere]

College Park, Md. : American Institute of Physics (AIP)

The Journal of Chemical Physics 90 (1989), S. 3838-3842

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ISSN: 1089-7690

Quelle: AIP Digital Archive

Thema: Physik , Chemie und Pharmazie

Notizen: The orientational order parameters 〈P2〉 and 〈P4〉, of cadmium stearate Langmuir–Blodgett multilayers have been calculated from steady state fluorescence anisotropy experiments. It has been shown that it is valid to model the polarization components using the assumptions that the fluorescent probes are axially symmetric, the film is azimuthally symmetric within the plane, and that the rotational motion is slow enough to be neglected. Although the data do not preclude a dependence of anisotropy on thickness, within the sample-to-sample variations, there is no significant effect of thickness on orientational order. The order parameters for newly deposited films are 〈P2〉=0.33 and 〈P4〉=0.02. The orientational order decreases in the first 600 h after deposition, and then remains stable for at least several months.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.455789

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Digitale Medien

Synchrotron radiation applications of charge coupled device detectors (invited) : Proceedings of the 4th international conference on synchrotron radiation instrumentation (1992)

Clarke, Roy ; Lowe, Walter P. ; MacHarrie, R. A. ; [weitere]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 63 (1992), S. 784-789

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ISSN: 1089-7623

Quelle: AIP Digital Archive

Thema: Physik , Elektrotechnik, Elektronik, Nachrichtentechnik

Notizen: Scientific charge coupled devices (CCDs) offer many opportunities for high brightness synchrotron radiation applications where good spatial resolution and fast data acquisition are important. We describe the use of virtual-phase CCD pixel arrays as two-dimensional area detectors illustrating the techniques with results from recent x-ray scattering, imaging, and absorption spectroscopy studies at NSLS, CHESS, SRC, and LURE DCI. The virtual phase architecture allows direct frontside illumination of the CCD detector chips giving advantages in the speed and sensitivity of the detector. Combining developments in x-ray optics (dispersive geometry), position sensitive area detectors (CCDs), and fast data acquisition, we have been able to perform time-resolved measurements at the microsecond level. Current developments include faster data transfer rates so that the single bunch timing structure of third generation synchrotron sources can be exploited.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1142662

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Electron optical benches for in-line and branched systems. A new bench designed for mirror-based aberration correction and low energy electron microscopy (1994)

Skoczylas, Walter P. ; Rempfer, Gertrude F. ; Griffith, O. Hayes

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 65 (1994), S. 3183-3193

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ISSN: 1089-7623

Quelle: AIP Digital Archive

Thema: Physik , Elektrotechnik, Elektronik, Nachrichtentechnik

Notizen: A review of electron optical bench literature is presented, and the designs of two optical benches used by the authors are described. One bench was designed for testing individual electrostatic electron lenses and in-line optical systems, for example, emission electron microscopes and transmission electron microscopes. It has been in operation for many years. The second electron optical bench is new. It is a branched system designed for several purposes: to study correction of spherical and chromatic aberration with an electron mirror, and to gain experience with low energy electron microscopy (LEEM) optics. The alignment of the electron optical support structure is independent of the vacuum housing, and the bench is designed to be operated either horizontally or vertically. As a demonstration of the performance of the new bench in the horizontal mode, a test pattern on a silicon surface was imaged with LEEM optics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1144548

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