ISSN:
1476-4687
Quelle:
Nature Archives 1869 - 2009
Thema:
Biologie
,
Chemie und Pharmazie
,
Medizin
,
Allgemeine Naturwissenschaft
,
Physik
Notizen:
[Auszug] Probing the structure of material layers just a few nanometres thick requires analytical techniques with high depth sensitivity. X-ray photoelectron spectroscopy (XPS) provides one such method, but obtaining vertically resolved structural information from the raw data is not ...
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1038/35019025
Permalink