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  • 1
    Publication Date: 2018-06-08
    Type: 2002 NASA/JPL Workshop for Fundamental Physics in Space; Dana Point, CA; United States
    Format: text
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  • 2
    Publication Date: 2006
    Keywords: TF IV ; Task Force IV ; Ultra-Deep Continental Crust Subduction (UDCCS)
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  • 3
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    In:  CASI
    Publication Date: 2005-11-30
    Description: The electrical characteristics of FCC are investigated in the context of multiple transmission lines theory. Analytical expressions for the coefficients of capacitance of conductors in a single cable are obtained. Numerical values calculated with these expressions are in good agreement with experimental data. Crosstalk, attenuation constants and phase angles of the current and voltage in flat conductor cable are also calculated.
    Keywords: ELECTRONIC EQUIPMENT
    Type: NASA. Marshall Space Flight Center Flat Conductor Cable Symp.; 34 p
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  • 4
    Publication Date: 2011-08-19
    Description: The mechanism that locates a shock wave in a transonic flow in one and two dimensions is examined. It is found that in one dimension the shock is located by specifying the downstream pressure whereas in two dimensions the shock is located by the application of an entropy condition at the sonic line.
    Keywords: AERODYNAMICS
    Type: ASME, Transactions, Journal of Applied Mechanics (ISSN 0021-8936); 53; 203-205
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  • 5
    Publication Date: 2011-08-11
    Description: Defects in silicon p-n solar cells with Li diffused N region produced by electron irradiation and spontaneously annealed at room temperature interpreted as Li ions
    Keywords: PHYSICS, SOLID-STATE
    Type: APPLIED PHYSICS LETTERS
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  • 6
    Publication Date: 2011-08-12
    Description: Defect concentration dependence of isothermal annealing rate of electron bombardment induced radiation defects in lithium doped n-type silicon
    Keywords: Solid-State Physics
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  • 7
    Publication Date: 2011-08-12
    Description: Spontaneous annealing at room temperature of electron induced defect in Li diffused oxygen- rich Si
    Keywords: PHYSICS, SOLID-STATE
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  • 8
    Publication Date: 2011-08-16
    Description: The degradation in performance of lithium-compensated silicon nuclear particle detectors induced by irradiation at room temperature with 0.6-MeV and 1.5-MeV electrons, 1.9-MeV protons, and fast neutrons from a plutonium-beryllium source has been investigated. With increasing fluence, the irradiations produced an increase of detector leakage current, noise, capacitance, and a degradation in the performance of the detector as a charged-particle energy spectrometer. Following the irradiations, annealing effects were observed when the detectors were reverse-biased at their recommended operating voltages. Upon removal of bias, a continuous degradation of detector performance characteristics occurred. Detectors which had been damaged by electrons and protons exhibited a stabilization in their characteristics within two weeks after irradiation, whereas detectors damaged by neutrons had a continuous degradation of performance over a period of several months.
    Keywords: PHYSICS, SOLID-STATE
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  • 9
    Publication Date: 2011-08-16
    Description: The improved infrared response (IRR) technique has been used to qualitatively compare radiation effects on Si(Li) detectors with energy levels reported for silicon in the literature. Measurements have been made on five commercial silicon detectors and one fabricated in-house, both before and after irradiation with fast neutrons, 1.9-MeV protons, and 1.6-MeV electrons. Effects dependent upon the extent of radiation damage have been observed. It seems likely that the photo-EMF, or photo-voltage, effect is the basic mechanism for the observation of IRR in p-i-n diodes with a wide i-region. Experimental characteristics of the IRR measurement are in agreement with those of the photovoltage effect.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
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  • 10
    Publication Date: 2013-08-31
    Description: We reported the direct relationship of Ce anomalies recorded in 0.2-119 Ma CaCO3 sediments (Ce(sup A*)) to the Ce anomalies in the parental Pacific deep seawater (Ce(sup A)) and their relationship to atmospheric P(CO2) relative to present P(CO2). We have analyzed continental CaCO3 samples that were deposited in ancient oceans and shallow sea platforms less than 200 m over central USA, central Europe, China, and Saudi-Arabia/Oman. We have plotted Ce(sup A*) over the 75-470 Ma interval. For P(CO2) calculations, we assumed as a reference standard the less than 200 m mixed Pacific Ocean with a Ce(sup A) geometric mean of 0.22 and a range of 0.10-0.43. Because P(CO2) values obtained from reliable deep Pacific Ocean carbonates in the 67-119 Ma interval were similar to the present P(CO2) values, we have drawn a 1.0 ratio for that interval. Although there is considerable scatter among the approximately 150 Ma carbonates, the average Ce(sup A*) value suggests that P(CO2) increased during the early Cretaceous, from 1.0X at approximately 120 Ma to about 1.4X at approximately 150 Ma. At approximately 250 Ma, the average Ce(sup A*) in 13 shallow sea China carbonates agrees well with the single and more reliable approximately 250 Ma China carbonate deposited in deeper open platform. We suggest that P(CO2) ranged from 1.4-1.7X over the Jurassic and Triassic periods. At approximately 280 Ma, three China carbonates deposited in deeper open platforms and therefore considered more reliable are consistent with a European carbonate, which indicate Ce(sup A) and P(CO2) values similar to the present. The minimum at this time corresponds to the great Permo-Carboniferous glaciation. From 280 Ma to 470 Ma, the trend favors increasing Ce(sup A*) and corresponding P(CO2) values between 1.9-2.7X, with a more reliable value closer to 2.7X at 430 Ma because of the unknown higher temperature in the less than 100 m seawater over continental USA which was located just south of the equator at approximately 430 Ma.
    Keywords: GEOPHYSICS
    Type: Lunar and Planetary Inst., Twenty-Fourth Lunar and Planetary Science Conference. Part 2: G-M; p 887-888
    Format: application/pdf
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