Publication Date:
2011-08-16
Description:
The strong projectile-charge-state dependence of K X-ray production in gases establishes a charge-state scale for ions penetrating solids. Si K X-ray cross sections in gaseous SiH4 were compared to those in solid Si for 40-MeV O (6+ to 8+) and 86-MeV Ar (6+ to 16+) projectiles. For Ar an effective charge of 11 plus or minus one is found compared to an emergent charge of 14.8 plus or minus 0.5. The result is discussed in terms of alternate models for steady-state excitation in solids.
Keywords:
PHYSICS, ATOMIC, MOLECULAR, AND NUCLEAR
Type:
Physical Review Letters; 33; Sept. 23
Format:
text
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