Publication Date:
2013-07-10
Description:
Author(s): S. K. Rhode, M. K. Horton, M. J. Kappers, S. Zhang, C. J. Humphreys, R. O. Dusane, S. -L. Sahonta, and M. A. Moram Aberration-corrected scanning transmission electron microscopy was used to investigate the core structures of threading dislocations in undoped GaN films with both high and low dislocation densities, and in a comparable high dislocation density Mg-doped GaN film. All a -type dislocations in all sampl... [Phys. Rev. Lett. 111, 025502] Published Tue Jul 09, 2013
Keywords:
Condensed Matter: Structure, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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