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Magnetic-structure analysis in scanning electron beam devices by means of the LEED Spin-polarization detector (1985)

Kirschner, J.

Springer

Applied physics 36 (1985), S. 121-123

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ISSN: 1432-0630

Keywords: 75.50 B ; 75.65 + ; 79.20 H

Source: Springer Online Journal Archives 1860-2000

Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics

Notes: Abstract Magnetic-structure analysis by means of spin-polarization analysis of the secondary electrons in a scanning electron microscope-type (SEM) experiment is demonstrated, using the LEED spin-polarization detector. The advantages in size, handling ability and efficiency, relevant for SEM operation, are pointed out. Limitations and future development are discussed.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF00624930

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