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  • Electronic structure and strongly correlated systems  (1)
  • stability index  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Euphytica 28 (1979), S. 17-24 
    ISSN: 1573-5060
    Keywords: Avena sativa ; oats ; yield ; production response ; stability index
    Source: Springer Online Journal Archives 1860-2000
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition
    Notes: Summary We tested three sets of oat varieties for grain yield in a series of environments and observed that generally more than 80% of the yield variation for individual varieties was due to linear regression response. Mean yields for varieties were significantly variable in all three sets, and regression response indexes were significantly variable in two of them. Mean yields over the three sets were correlated with regression response indexes with r=0.61. Associations of mean yield with the three stability parameters (i.e., coefficient of determination, mean square for deviations from regression, and ecovalence) were low and usually not significant. The correlation of regression response indexes with coefficients of determination was 0.42, but neither of the other stability parameters was associated with the response indexes. The three stability parameters were closely correlated with one another. Our materials were selected varieties, so evidently our results suggest what can be accomplished in breeding for combinations of mean production, production response, and productiom stability.
    Type of Medium: Electronic Resource
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  • 2
    Publication Date: 2013-12-17
    Description: Author(s): L. Vidmar, S. Langer, I. P. McCulloch, U. Schneider, U. Schollwöck, and F. Heidrich-Meisner We investigate the expansion of bosons and fermions in a homogeneous lattice after a sudden removal of the trapping potential using exact numerical methods. As a main result, we show that in one dimension, both bosonic and fermionic Mott insulators expand with the same velocity, irrespective of the ... [Phys. Rev. B 88, 235117] Published Mon Dec 16, 2013
    Keywords: Electronic structure and strongly correlated systems
    Print ISSN: 1098-0121
    Electronic ISSN: 1095-3795
    Topics: Physics
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