Electronic Resource
Amsterdam
:
Elsevier
Microelectronic Engineering
18 (1992), S. 253-258
ISSN:
0167-9317
Keywords:
EEPROM
;
device programming
;
device simulation
;
high injection MOS
;
hot electron injection
;
split gate flash devices
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Electrical Engineering, Measurement and Control Technology
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1016/S0167-9317(05)80006-1
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