ISSN:
1573-8663
Keywords:
film
;
pulsed laser deposition
;
SrBi2Ta2O9
;
fluorite
;
X-ray diffraction
;
selected area electron diffraction
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Epitaxial Sr-Bi-Ta oxide films of a cubic fluorite-like structure were grown by pulsed laser deposition. As the laser fluence increased, the lattice constant decreased. It was revealed that the Ta ion concentration was closely related with the change in the lattice constant. From selected area electron diffraction measurements, it was observed that the films had a superstructure which seemed to come from ordering of metal ions.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1009996720919
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