ISSN:
0142-2421
Keywords:
XPS
;
x-ray photoelectron spectroscopy
;
deconvolution
;
resolution
;
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
The maximum entropy method (MEM) is applied to the deconvolution of x-ray photoelectron spectra. This method provides the least-biased estimate of the unbroadened spectrum by using the Shannon information content as the regularizing functional. The large-scale, non-linear optimization problem is solved using a robust variable metric sequential-quadratic programming (SQP) algorithm implemented on a personal computer (PC). The program is tested on simulated spectra and then shown to provide reliable resolution enhancement of measured spectra by unfolding a measured instrumental resolution function. Typical resolution enhancements of 50% are achievable in 〈15 min of computer time. © 1998 John Wiley & Sons, Ltd.
Additional Material:
7 Ill.
Type of Medium:
Electronic Resource
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