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  • Articles  (2)
  • porous silicon  (2)
  • Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics  (2)
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  • Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Journal of porous materials 7 (2000), S. 239-242 
    ISSN: 1573-4854
    Keywords: porous silicon ; interference fringes ; infrared-spectroscoy
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Here we present the software utility “ProSpect” which allows to process and interpret the data of infrared spectrophotometry studies of thin porous films. These spectra are often complicated by the presence of interference fringes. The program allows to remove fringes and thus enhance the intensity of useful IR bands as well as calculate optical parameters of the films (medium thickness value, refractive index, deviation of the thickness from medium value). Application of ProSpect in analysis of the FT-IR spectra of non-uniform porous silicon films is illustrated.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Journal of porous materials 7 (2000), S. 279-282 
    ISSN: 1573-4854
    Keywords: porous silicon ; optical absorption ; theoretical modelling
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The optical properties of porous silicon (p-Si) are calculated from the electronic band structure obtained by means of an sp3s* tight-binding Hamiltonian and a supercell model, in which the pores are columns detched in crystalline silicon (c-Si). The disorder in the pore sizes and the undulation of the silicon wires are considered by the existence of arandom perturbative potential, which produces non-vertical interband transitions, otherwise forbidden. A typical interval around each k-vector (optical window), where non-vertical transitions make an important contribution, depends on the value of the disorder and its order of magnitude is given by l−1, where l is the localization length. The calculated absorption spectra are compared with experiments, showing good agreement.
    Type of Medium: Electronic Resource
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