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  • photoelectron emission microscopy (PEEM)  (1)
  • photoemission electron microscopy  (1)
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  • 1
    ISSN: 1572-879X
    Keywords: chemical waves ; NO reduction ; Rh ; Pt ; microstructured composite surfaces ; dynamical imaging ; scanning photoemission microscopy ; SPEM ; photoemission electron microscopy ; PEEM
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract The catalytic reduction of NO by hydrogen is investigated at (T = 650 K and (p≈10-6 mbar on a microstructured Rh/Pt(100) surface consisting of Pt(100) domains surrounded by a 600 Åthick Rh film. Synchrotron radiation scanning photoemission microscopy (SPEM), using photons focused into a spot of less than 0.2 μm diameter, is employed as a spatially and chemically resolving in situ technique. The chemical waves which arise in the bistable system NO+H2/Rh are imaged with SPEM monitoring the N 1s and O 1s photoelectrons. The reaction fronts initiate transitions from an inactive oxygen-covered surface (ΘO≈0.25 ML) to a reactive nitrogen-covered surface (ΘN≈0.06 ML). At the Pt/Rh interface, synergetic effects can be observed: the chemical waves on the Rh film nucleate preferentially at the Pt/Rh interface. This nucleation is poisoned by carbon contamination on the Pt area but is prevented in the vicinity of the Pt/Rh interface by the adjacent clean Rh film. No segregation of Pt to the surface was observed for the 600 Å thick Rh film.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1572-879X
    Keywords: bimetallic catalysts ; platinum ; rhodium ; O2 + H2 reaction ; pattern formation ; scanning photoelectron microscopy (SPEM) ; photoelectron emission microscopy (PEEM) ; Turing structure
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract The O2 + H2 reaction has been studied under low pressure conditions (10-5 mbar) employing a microstructured Rh(110)/Pt surface as catalyst. Photoemission electron microscopy (PEEM) and scanning photoelectron microscopy (SPEM) were used as spatially resolving in situ methods. Under reaction conditions stationary concentration patterns (Turing‐like structures) of the adsorbates develop inside the Pt domains which are associated with a compositional change of the metallic substrate.
    Type of Medium: Electronic Resource
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