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  • 1995-1999  (1)
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  • 1995-1999  (1)
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    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 26 (1998), S. 455-460 
    ISSN: 0142-2421
    Keywords: electron transport ; background correction ; partial intensities ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A recently developed procedure to eliminate the inelastic tail below the characteristic peaks in AES/XPS spectra is analysed theoretically and tested using experimental Auger spectra from four homogeneous solids (Au, Pt, Ta and Ni). To this end, the parameter in this procedure accounting for the details of the emission process was determined for the cylindrical mirror analyser (CMA) geometry. It is shown that application of this procedure to the raw data consistently removes the inelastic tail accompanying each characteristic peak, while at the same time the background of secondaries (and, in the case of electron-excited AES, the contribution of backscattered primaries) can be strongly suppressed, rendering the task of peak area determination trivial. The proposed procedure is shown to be applicable over a wide energy range, significantly exceeding the quasi-elastic regime. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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