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  • normal coordinate analysis  (1)
  • 1995-1999  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Molecular Structure of Silicon Tetraiodide (1998)
    Springer
    Structural chemistry 9 (1998), S. 349-352 
    Details
    ISSN: 1572-9001
    Keywords: Silicon tetraiodide ; molecular structure ; electron diffraction ; normal coordinate analysis
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract The molecular geometry of silicon tetraiodide was determined by gas-phase electron diffraction at 378 K. The molecule has a regular tetrahedral shape with an Si—I bond length (r g) of 2.432(5) Å and an I⋅⋅⋅I nonbonded distance (r g) of 3.971(8) Å. There is an apparent anharmonicity in both the stretching and the bending vibrations, with the latter especially pronounced.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1022462926682
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