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  • high temperature  (2)
  • 1
    Electronic Resource
    Electronic Resource
    Thermophysical properties data on molten semiconductors (1992)
    Springer
    International journal of thermophysics 13 (1992), S. 1061-1084 
    Details
    ISSN: 1572-9567
    Keywords: density ; GaAs ; GaSb ; Ge ; high temperature ; InP ; InSb ; molten state ; semiconductors ; Si ; surface tension ; thermal conductivity ; viscosity
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Thermophysical properties of molten semiconductors are reviewed. Published data for viscosity, thermal conductivity, surface tension, and other properties are presented. Several measurement methods often used for molten semiconductors are described. Recommended values of thermophysical properties are tabulated for Si, Ge, GaAs, InP, InSb, GaSb, and other compounds. This review shows that further measurements of thermophysical properties of GaAs and InP in the molten state are required. It is also indicated that a very limited amount of data on emissivity is available. Space experiments relating to thermophysical property measurements are described briefly.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01141216
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  • 2
    Electronic Resource
    Electronic Resource
    Measurement of the thermal conductivity of molten semiconductors (1988)
    Springer
    International journal of thermophysics 9 (1988), S. 933-940 
    Details
    ISSN: 1572-9567
    Keywords: alumina ; high temperature ; InSb ; thermal conductivity ; transient hot-wire method
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The thermal conductivity of molten InSb in the temperature range between 800 and 870 K was measured by the transient hot-wire method using a ceramic probe. The probe was fabricated from a tungsten wire printed on an alumina substrate and coated with a thin alumina layer. The thermal conductivity was found to be about 18 W· m−·K−at the melting point and increased moderately with increasing temperature. The thermal conductivity of alumina used as the substrate for the probe was also measured in the same temperature range.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01133261
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