ISSN:
1573-4862
Keywords:
Residual stress
;
high energy synchrotron diffraction
;
energy dispersive diffraction
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Mathematics
Notes:
Abstract High energy synchrotron diffraction is introduced as a new method for residual stress analysis in the bulk of materials. It is shown that energy dispersive measurements are sufficiently precise so that strains as small 10−4 can be determined reliably. Due to the high intensity and the high parallelism of the high energy synchrotron radiation the sample gauge volume can be reduced to approximately 50 μm × 1 mm × 1 mm compared to gauge volume of one mm3 up to several mm3 achievable by neutron diffraction. The benefits of the high penetration depth and the small gauge volume are demonstrated by the results of stress studies performed on a fiber reinforced ceramic, a functional gradient material and a metal–ceramic compound. Furthermore, it is shown that in case of a cold extruded metal specimen the energy dispersive measurement technique yields simultaneous information about texture and residual stresses and thus allows a detailed investigation of elastic and plastic deformation gradients.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1022607030355
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