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  • electrical properties  (1)
  • 1
    ISSN: 1572-9605
    Keywords: layered compounds ; 8-8-20 ; x-ray diffraction ; electrical properties
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract With an attempt to increase the Cu valence, we synthesized the (La1−x Sr x )8Cu8O20−δ (8-8-20 phase) compounds with large x using an O2-HIP apparatus. By heat treatment in a high-pressure of oxygen gas (40 MPa), the 8-8-20 compounds were stabilized in the range of 0.25 ≤ x ≤ 0.65. Their crystal structures, characterized by x-ray Rietveld refinement and electron diffraction, are tetragonal, space group P4/mbm. The formal copper valence was found to increase with Sr concentration from 2.24 at x = 0.25 to 2.63 at x = 0.65, keeping the oxygen content constant around 20.0. Electrical resistivity and magnetic susceptibility showed only metallic behavior from room temperature down to 5 K with no sign of superconductivity.
    Type of Medium: Electronic Resource
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