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  • atomic force microscopy  (1)
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    ISSN: 1573-2711
    Keywords: nanotribology ; friction ; contact area ; atomic force microscopy ; diamond ; tungsten carbide
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The nanotribological properties of a hydrogen‐terminated diamond(111)/tungsten‐carbide interface have been studied using ultra‐high vacuum atomic force microscopy. Both friction and local contact conductance were measured as a function of applied load. The contact conductance experiments provide a direct and independent way of determining the contact area between the conductive tungsten‐carbide AFM tip and the doped diamond sample. We demonstrate that the friction force is directly proportional to the real area of contact at the nanometer‐scale. Furthermore, the relation between the contact area and load for this extremely hard heterocontact is found to be in excellent agreement with the Derjaguin–Müller–Toporov continuum mechanics model.
    Type of Medium: Electronic Resource
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