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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Microchimica acta 114-115 (1994), S. 247-254 
    ISSN: 1436-5073
    Keywords: YBaCuO ; irradiation defects ; depth profiling
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract The question of destructibility of an ion beam technique applied to the analysis of high temperature superconductors is discussed, namely the influence of the often used analyzing4He ion beam on a monocrystalline YBa2Cu3O7 film. The rate of irradiation defect production is measured for 1 and 3.07 MeV4He+ irradiation and compared with a Monte Carlo simulation. It is shown that the usual depth profiling by4He ion beams does not change the measured element profiles, but is destructive from the view point of the superconducting properties of a sample, due to the great number of defects produced. Using a large solid angle detector one can minimize the analyzing dose to avoid the destruction of superconducting properties.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1436-5073
    Keywords: YBaCuO ; thin film ; annealing ; depth profiling ; diffusion
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract Changes in element depth profiles in a YBaCuO superconducting film on a SrTiO3 substrate due to one year aging and annealing were investigated by the ion backscattering technique. Crystal perfection of the film was checked by the X-ray rocking curve method. It was found that the film was polycrystalline, with the preferred orientation of thec axis along the normal to the substrate surface with an angle dispersion of 2 °, and that the in-planea andb axes were randomly orientated. The aging experiments have shown that the oxygen content in the surface region increases with the time constant τ = 20 days. Annealing in a vacuum at 100 °C restores the initial oxygen content. After 2 hours of annealing in an oxygen atmosphere at 400 °C, an unexpectedly strong change in oxygen and copper depth profiles is observed. Since a strong correlation exists between the profile changes, a hypothesis has been advanced about the relationship between oxygen and copper transport in the process of annealing. Taking into account the polycrystalline structure of the film, one can conclude that intergrain diffusion dominates in the oxygen and copper transport.
    Type of Medium: Electronic Resource
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