Publication Date:
2011-08-20
Description:
Author(s): B. Julsgaard, Y.-W. Lu, R. V. Skougaard Jensen, T. G. Pedersen, K. Pedersen, J. Chevallier, P. Balling, and A. Nylandsted Larsen From photoluminescence measurements on sensitized erbium in a -Si/ SiO 2 :Er/ SiO 2 multilayers, we determine the characteristic interaction length of the sensitization process from the silicon-layer sensitizer to the erbium-ion receiver to be 0.22±0.02 nm. By using sufficiently low temperatures in the fa... [Phys. Rev. B 84, 085403] Published Fri Aug 19, 2011
Keywords:
Surface physics, nanoscale physics, low-dimensional systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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