Publication Date:
2011-03-01
Description:
Author(s): M. Nakayama, K. Miyazaki, T. Kawase, and D. Kim We have investigated the active-layer-thickness dependence of exciton-photon interactions in planar CuCl microcavities with HfO_{2} /SiO_{2} distributed Bragg reflectors. The active layer thickness was changed from λ/32 to λ/4, while the cavity length was fixed at λ/2. We performed angle-resolved... [Phys. Rev. B 83, 075318] Published Mon Feb 28, 2011
Keywords:
Semiconductors II: surfaces, interfaces, microstructures, and related topics
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
Permalink