Publication Date:
2011-08-24
Description:
Predictions of fatigue crack growth behavior can be made with the Fatigue Crack Growth Structural Analysis (FASTRAN II) computer program. As cyclic loads are applied to a selected crack configuration with an initial crack size, FASTRAN II predicts crack growth as a function of cyclic load history until either a desired crack size is reached or failure occurs. FASTRAN II is based on plasticity-induced crack-closure behavior of cracks in metallic materials and accounts for load-interaction effects, such as retardation and acceleration, under variable-amplitude loading. The closure model is based on the Dugdale model with modifications to allow plastically deformed material to be left along the crack surfaces as the crack grows. Plane stress and plane strain conditions, as well as conditions between these two, can be simulated in FASTRAN II by using a constraint factor on tensile yielding at the crack front to approximately account for three-dimensional stress states. FASTRAN II contains seventeen predefined crack configurations (standard laboratory fatigue crack growth rate specimens and many common crack configurations found in structures); and the user can define one additional crack configuration. The baseline crack growth rate properties (effective stress-intensity factor against crack growth rate) may be given in either equation or tabular form. For three-dimensional crack configurations, such as surface cracks or corner cracks at holes or notches, the fatigue crack growth rate properties may be different in the crack depth and crack length directions. Final failure of the cracked structure can be modelled with fracture toughness properties using either linear-elastic fracture mechanics (brittle materials), a two-parameter fracture criterion (brittle to ductile materials), or plastic collapse (extremely ductile materials). The crack configurations in FASTRAN II can be subjected to either constant-amplitude, variable-amplitude or spectrum loading. The applied loads may be either tensile or compressive. Several standardized aircraft flight-load histories, such as TWIST, Mini-TWIST, FALSTAFF, Inverted FALSTAFF, Felix and Gaussian, are included as options. FASTRAN II also includes two other methods that will help the user input spectrum load histories. The two methods are: (1) a list of stress points, and (2) a flight-by-flight history of stress points. Examples are provided in the user manual. Developed as a research program, FASTRAN II has successfully predicted crack growth in many metallic materials under various aircraft spectrum loading. A computer program DKEFF which is a part of the FASTRAN II package was also developed to analyze crack growth rate data from laboratory specimens to obtain the effective stress-intensity factor against crack growth rate relations used in FASTRAN II. FASTRAN II is written in standard FORTRAN 77. It has been successfully compiled and implemented on Sun4 series computers running SunOS and on IBM PC compatibles running MS-DOS using the Lahey F77L FORTRAN compiler. Sample input and output data are included with the FASTRAN II package. The UNIX version requires 660K of RAM for execution. The standard distribution medium for the UNIX version (LAR-14865) is a .25 inch streaming magnetic tape cartridge in UNIX tar format. It is also available on a 3.5 inch diskette in UNIX tar format. The standard distribution medium for the MS-DOS version (LAR-14944) is a 5.25 inch 360K MS-DOS format diskette. The contents of the diskette are compressed using the PKWARE archiving tools. The utility to unarchive the files, PKUNZIP.EXE, is included. The program was developed in 1984 and revised in 1992. Sun4 and SunOS are trademarks of Sun Microsystems, Inc. IBM PC is a trademark of International Business Machines Corp. MS-DOS is a trademark of Microsoft, Inc. F77L is a trademark of the Lahey Computer Systems, Inc. UNIX is a registered trademark of AT&T Bell Laboratories. PKWARE and PKUNZIP are trademarks of PKWare, Inc.
Keywords:
STRUCTURAL MECHANICS
Type:
LAR-14944
Format:
text
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