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Effects of cosmic rays on single event upsets (1989)

Venable, D. D. ; Fogarty, T. N. ; Olidapupo, A. ; [et al.]

In: CASI

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Publication Date: 2019-06-28

Description: Assistance was provided to the Brookhaven Single Event Upset (SEU) Test Facility. Computer codes were developed for fragmentation and secondary radiation affecting Very Large Scale Integration (VLSI) in space. A computer controlled CV (HP4192) test was developed for Terman analysis. Also developed were high speed parametric tests which are independent of operator judgment and a charge pumping technique for measurement of D(sub it) (E). The X-ray secondary effects, and parametric degradation as a function of dose rate were simulated. The SPICE simulation of static RAMs with various resistor filters was tested.

Keywords: SPACE RADIATION

Type: NASA-CR-184835 , NAS 1.26:184835

Format: application/pdf

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