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Cosmic ray simulation and testing program (1985)

Kolasinski, W. A. ; King, C. G. ; Koga, R. ; [et al.]

In: CASI

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Publication Date: 2019-07-13

Description: Single event upset (SEU) and latchup vulnerabilities were determined for a number of parts of interest to NASA space programs. In cases where a threshold linear energy transfer (LET) for SEU could be measured, an upset rate in a low inclination Space Shuttle orbit was computed. The predicted upset rates are extremely low, except for the devices with LET thresholds below the geomagnetic cutoff for altitude and inclination of the Space Shuttle orbit. While some of the devices do exhibit latchup, the cross sections and threshold LETs are such that the risk associated with flying these devices in low, near equatorial orbits is small if not negligible.

Keywords: SPACE RADIATION

Type: NASA-CR-177860 , NAS 1.26:177860

Format: application/pdf

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