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Test of algorithm for background correction in XPS under variation of XPS peak energy (1988)

Tougaard, S. ; Braun, W. ; Holub-Krappe, E. ; [et al.]

Chichester [u.a.] : Wiley-Blackwell

Surface and Interface Analysis 13 (1988), S. 225-227

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ISSN: 0142-2421

Keywords: Chemistry ; Polymer and Materials Science

Source: Wiley InterScience Backfile Collection 1832-2000

Topics: Physics

Notes: The consistency of a recently proposed algorithm for background correction in XPS is studied, under variation of the XPS peak energy, by use of synchrotron radiation. Two approximations for the inelastic scattering properties of the solid are investigated. Both algorithms are found to account well for the variation in the inelastic scattering properties of the solid when the Au 4f XPS peak energy is varied. Small differences can be ascribed to the influence of surface excitations which are not included in the algorithm.

Additional Material: 4 Ill.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1002/sia.740130409

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