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  • Polymer and Materials Science  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    Internal analyser inelastic scattering effects in XPS quantitative analysis (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 22 (1994), S. 98-102 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The shape of spectrum in XPS depends on processes in the sample and on the properties of measurements systems. Noise, electron energy analyser resolution, electron inelastic scattering in the sample and analyser, and non-monochromatic radiation produce a quality reduction of spectrum for quantitative analysis. The undesired scattering of electrons on the outer hemisphere of the analyser or into the lens system leads to spectral background shape distortion and difficulties in the analysis of intensity transmission and resolution functions. A new mathematic procedure, based on deconvolution method, for evaluation and removing instrumental artefact is proposed.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740220124
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    XPS analysis of sol-gel processed doped and undoped TiO2 films for sensors (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 22 (1994), S. 376-379 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: We have used x-ray photoelectron spectroscopy (XPS) to probe the actual surface composition of alkali-doped and undoped TiO2 films prepared by the sol-gel technique. The role of thermal pretreatments, conducted at various temperatures, and the effect of doping with Na are discussed. XPS results are compared with the electrical response of prototype devices having TiO2 films as the active element, with the help of electrochemical impedance spectroscopy (EIS) measurements.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740220182
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    Paper (German National Licenses)
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