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  • 1
    Electronic Resource
    Electronic Resource
    Innovative Methods for a Deconvolution of XPS Spectra from Plasma-oxidized Polyethylene (1996)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 24 (1996), S. 405-410 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: X-ray photoelectron spectroscopy (XPS) has been used to study the chemical effects of oxygen plasma treatment on polyethylene films. A comparison of previous investigations shows that the simple deconvolution by curve-fitting leads to contradictory results. For a deconvolution we used innovative methods. The maximum entropy algorithm leads to a valid identification of chemical states. A proper consideration of the background shows that a linear background is not appropriate. For this reason, we used a model for an insulator loss function which was inspired by the loss function calculated from optical data. The model depends on four parameters which were included in the fitting process. The background calculation was performed according to the method of S. Tougaard and co-workers.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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    Paper (German National Licenses)
  • 2
    Electronic Resource
    Electronic Resource
    Combined depth profile analysis with SNMS, SIMS and XPS: Preferential sputtering and oxygen transport in binary metal oxide multilayer systems (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 22 (1994), S. 9-13 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Depth profile measurements of binary metal oxide multilayer systems have been performed by combined SIMS, SNMS and XPS. The combination of data about the particle fluxes and thus the bulk stoichiometry by SNMS, the ionic fluxes by SIMS, and the surface composition and the oxidation state of the metals by XPS provides a detailed insight into the mechanism of preferential sputtering in these systems. We present results on the systems Al2O3/TiO2 and SiO2/HfO2. The signal behaviour at the interfaces cannot be explained by preferential sputtering alone, but must include an oxygen transport mechanism due to chemical driving forces. By comparison of these systems with four other multilayer systems, we have developed a model of combined preferential sputtering and oxygen transport which accounts for the experimental results. The investigated systems can be classified according to their metal/oxygen sputter yield ratio, the degree of preferential sputtering, and the heat of formation of the oxide.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740220105
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  • 3
    Electronic Resource
    Electronic Resource
    Spectral Noise Distortion in Photoelectron Spectroscopy by Acquiring Data with Multidetector Systems (1997)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 823-826 
    Details
    ISSN: 0142-2421
    Keywords: photoelectron spectroscopy ; statistical noise ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Acquiring data with multidetector systems leads in many cases to spectral distortion. The reason is the possible misfit in the energy separations of the detectors and the chosen energy step width. We present formulae for calculating the spectral distortion from the distances of the single detectors for two different methods of data treatment. From the formulae we can estimate the spectral distortion for typical conditions. Numerical simula-tions show that both methods affect not significant the resolution for typical conditions. The partitioning of the collected data between energy channels can result in a reducing of the noise to 30% of the true noise. We present a general formula for calculating this smoothing effect caused by the apportioning method, which is important for a correct statistical treatment of such distorted spectra. © 1997 by John Wiley & Sons, Ltd.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Some aspects of the fitting of XPS core spectra of polymers (1998)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 26 (1998), S. 204-212 
    Details
    ISSN: 0142-2421
    Keywords: XPS ; polymers ; least-squares fitting ; inelastic background ; Voigt function ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Determination of chemical structure by means of XPS through least-squares fitting of core lines is a widely used method. We present a model for the description of XPS core lines from polymers under simultaneous consideration of the lineshape and the inelastic background. For proper consideration of the background, a model loss function with free parameters was included in the fitting process. The free parameters of the model can be found by least-squares fitting. Using this procedure, XPS core lines of many polymers can be described over a range of 25 eV, which will be demonstrated for selected polymers (PcI, PGMA, PVMK, PPG, PVME, PAA, PE). The model could be easily modified to fit other classes of materials. It will be shown how statistical analysis of the data can be used to evaluate the fitting results. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 13 Ill.
    Type of Medium: Electronic Resource
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