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  • 1
    Electronic Resource
    Electronic Resource
    Present limits to the calculation of auger line intensities for film-substrate systems (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 199-205 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A new and simple algebraic expression for calculation of backscattering factors in the film-substrate systems has recently been proposed. The limits of its use with the Gryzinski ionization cross-section to calculate Auger line intensities were, however, not throughly discussed. We have examined more closely its range of validity using Monte Carlo simulation and recent experimental data available. Film-substrate systems of carbon films on Cu, Sn and Ta substrates and Cu films on C, Sn and Ta substrates were investigated. Our results have indeed shown that there are disagreements. Contributing factors to some of the disagreements include the proposed backscattering factor expression and the ionization cross-section used. New proposals for quantification were suggested using an alternative interpolation factor taking into account substrate scattering behavior and the Bethe ionization cross-section. Results of the new proposals did show significant improvements with the use of the Bethe ionization cross-section for the case of carbon film-substrate systems. Results for Cu film-substrates were not conclusive, with only one evident improvement for Cu/C using the Bethe cross-section.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740210306
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  • 2
    Electronic Resource
    Electronic Resource
    Backscattering Factor for KLL Auger Yield from Film-Substrate Systems (1996)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 24 (1996), S. 15-22 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Backscattering factor (R) between primary energies of 2-40 keV for film-substrate KLL Auger backscattering yield (RFS) is calculated via Monte Carlo simulation for C and Al films. Substrates ranging from Be (Z=4.0) to Au (Z=79.0) are used in the study. Results via a normalizedRFS (RN) function show that substrate effects are indeed present. This is especially so at higher primary energies and lower film atomic number. Electron range results also show that an important and meaningful quantity to describe the backscattering Auger yield with respect to film thickness is the mean backscattered energy penetration depth. This is found to be essentially different from the half-maximum electron range as proposed earlier. A power law can be used to describe the half-value range (i.e. the thickness for whichRN=0.5) with respect to primary energy. For Al film, however, a discontinuity in the power law is found for energies 〈4 keV. This is attributed mainly to the relatively large binding energy of the Al K-shell and also to the greater variation of the K-shell cross-section within the backscattered energy spectrum. A new analytical interpolation formula is proposed to calculateRFS. This model accounts for substrate effects at only primary energies 〉4 keV. At lower energies mean values are used instead. Besides the fitted parameters from our results, known bulkR expressions for film and substrate are also required for the practical use of the model.
    Additional Material: 10 Ill.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    The particle size of latexes from dispersion polymerization of styrene using poly(ethylene oxide) macromonomer as a polymerizable stabilizer (1997)
    Bognor Regis [u.a.] : Wiley-Blackwell
    Journal of Polymer Science Part A: Polymer Chemistry 35 (1997), S. 3575-3583 
    Details
    ISSN: 0887-624X
    Keywords: latexes ; dispersion polymerization ; styrene ; PEO macromonomer ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Notes: The particle sizes and their size distributions of latexes from the dispersion polymerization of styrene using a small amount of ω-methoxy poly(ethylene oxide)n undecyl-α-methacrylate macromonomer (PEO-R-MA-40) as a polymerizable stabilizer in ethanol-water media have been studied. Monodisperse or/and nearly monodisperse latex particles from 0.1 to 1 μm in diameter were readily obtained. The diameter of latex particles follows the relationship Dvad ∝ θ0.33 [PEO-R-MA-40]-0.60 [styrene]01.02 [AIBN]o-0.09, where θ is the fractional conversion of styrene. Except for the styrene concentration dependency, this relationship is in excellent agreement with the model developed by Paine11 and modified by Kawaguchi et al.13 When the surface composition of the grafted PEO macromonomer on the latex particles exceeded 16% as analyzed by X-ray photoelectron spectroscopy (XPS), the particles were nearly monodisperse. In terms of polymerization, this occurred around 18% conversion of styrene. Beyond this critical state of polymerization, the latex particles grew bigger with more PEO macromonomer-styrene copolymers situated on the particle surface. The effect of various factors on the particle size distribution is also discussed. © 1997 John Wiley & Sons, Inc. J Polym Sci A: Polym Chem 35: 3575-3583, 1997
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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