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  • Polymer and Materials Science  (3)
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  • 1
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 26 (1998), S. 606-614 
    ISSN: 0142-2421
    Keywords: XPS ; x-ray photoelectron spectroscopy ; calibration ; Fermi energy ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Calibration of the binding energy scale in x-ray photoelectron spectroscopy (XPS) requires location of the zero point. This zero point has previously been identified with the inflection point in the Fermi-edge region of a valence-band photoemission spectrum of nickel. Comparison of photoemission spectra of nickel and silver measured with monochromated x-rays shows that the inflection points near the Fermi edge differ by 45±5 meV (where the stated uncertainty indicates the standard uncertainty) at an instrumental energy resolution of 0.30 eV. This difference is due to differences in the valence-band densities of states (DOS) of the two metals. Simulations of the Ni photoemission spectrum have been performed based on the DOS calculated by Eckhardt and Fritsche, and the simulated spectrum agrees well with the measured spectrum in the near-edge region. Additional simulations of the Ni photoemission spectrum have been carried out with both monochromated Al x-rays and unmonochromated Mg and Al characteristic x-rays to determine how the Ni near-edge inflection point varies with the energy resolution of the electron energy analyzer in XPS. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 15 (1990), S. 541-549 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The Scienta ESCA300 is a state-of-the-art x-ray photoelectron spectrometer with high intensity, and high energy and spatial resolution. This unique combination of features is made possible by the use of a high-power rotating anode x-ray source with monochromatization, high transmission and imaging electron optics and a multichannel detector. The first ESCA300 has been installed recently at ICI Wilton. We report on the performance of this instrument for conducting samples and as a microanalytical device. Also described are its performance for insulating samples (polymer films) and studies of charge compensation using the Bremsstrahlung-induced electrons from an unmonochromated dual anode x-ray source.
    Additional Material: 16 Ill.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 17 (1991), S. 94-104 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: High-resolution C is and O is gas-phase X-ray photoelectron spectra of methyl isobutyrate, methyl methacrylate, methyl acrylate, acrylic acid, acetic acid and formic acid have been investigated as model compounds for solid poly(methyl methacrylate) (PMMA). Secondary chemical shifts, variations in peak shapes and intensities for the different core lines were observed. It is shown that asymmetries and differences in line widths of the component peaks should be considered for a correct analysis of the solid polymer spectra. The observed intensities of the different C 1s and O is peaks in the gas-phase spectra do not follow stoichiometric ratios owing to different shake-off/shake-up probabilities. The gas-phase core electron binding energies have been compared with ab initio ΔSCF calculations where the relaxation of the core-hole state was included. Using a group shift argument, the relationship between the gas-phase model molecule shifts and the solid PMMA shifts have been discussed and applied to the analysis of the PMMA spectra.
    Additional Material: 11 Ill.
    Type of Medium: Electronic Resource
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